Influence of Molecular Order on the Local Work Function of Nanographene Architectures: A Kelvin-Probe Force Microscopy Study

ChemPhysChem ◽  
2005 ◽  
Vol 6 (11) ◽  
pp. 2371-2375 ◽  
Author(s):  
Vincenzo Palermo ◽  
Matteo Palma ◽  
Željko Tomović ◽  
Mark D. Watson ◽  
Rainer Friedlein ◽  
...  
Keyword(s):  
Work Function ◽  
Microscopy Study ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Molecular Order ◽  
Force Microscopy ◽  
Local Work

Local work function of a rutile TiO2()-(1×1) surface observed by Kelvin probe force microscopy

2003 ◽  
Vol 529 (1-2) ◽  
pp. L245-L250 ◽  
Author(s):  
Akira Sasahara ◽  
Hiroshi Uetsuka ◽  
Hiroshi Onishi
Keyword(s):  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Local Work

scholarly journals Work function difference of naphthyl end-capped oligothiophene in different crystal alignments studied by Kelvin probe force microscopy

2020 ◽  
pp. 106060
Author(s):  
Mads Nibe Larsen ◽  
Mads Svanborg Peters ◽  
Rodrigo Lemos-Silva ◽  
Demetrio A. Da Silva Filho ◽  
Bjarke Jørgensen ◽  
...  
Keyword(s):  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Work Function Difference ◽  
Function Difference

Relation between work function and structural properties of triangular defects in 4H-SiC epitaxial layer: Kelvin probe force microscopic and spectroscopic analyses

Nanoscale ◽  
2020 ◽  
Vol 12 (15) ◽  
pp. 8216-8229
Author(s):  
Hong-Ki Kim ◽  
Soo In Kim ◽  
Seongjun Kim ◽  
Nam-Suk Lee ◽  
Hoon-Kyu Shin ◽  
...  
Keyword(s):  
Work Function ◽  
Structural Properties ◽  
Epitaxial Layer ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Spectroscopic Analyses ◽  
Work Function Difference ◽  
Function Difference

In the defective SiC epitaxial layer, the work function variation was observed by Kelvin probe force microscopy (KPFM), and the work function difference came from the variation of polytype and the disordered surface.

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