Kelvin Probe Force Microscopy Study of the Electrostatic System of the Crystal Surface of AuNi/GaN Schottky Diodes
2012 ◽
Vol 7
(6)
◽
pp. 1251-1255
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Keyword(s):
Keyword(s):
2005 ◽
Vol 44
(7B)
◽
pp. 5370-5373
◽
2007 ◽
Vol 17
(3)
◽
pp. 472-478
◽
Keyword(s):
2011 ◽
Vol 56
(4)
◽
pp. 1792-1798
◽
Keyword(s):
Keyword(s):