scholarly journals Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry

2013 ◽  
Vol 56 (9) ◽  
pp. 348-354 ◽  
Author(s):  
Takuya MIYAYAMA
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Argon Gas ◽  
X Ray ◽  
Practical Applications ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion

Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

2014 ◽  
Vol 46 (12-13) ◽  
pp. 1129-1132
Author(s):  
Makiko Fujii ◽  
Shunichirou Nakagawa ◽  
Toshio Seki ◽  
Takaaki Aoki ◽  
Jiro Matsuo
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Argon Gas ◽  
Ion Mass Spectrometry ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion

Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples

2014 ◽  
Vol 28 (8) ◽  
pp. 917-920 ◽  
Author(s):  
Makiko Fujii ◽  
Shunichirou Nakagawa ◽  
Kazuhiro Matsuda ◽  
Naoki Man ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Detection Limits ◽  
Argon Gas ◽  
Ion Mass Spectrometry ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion
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