Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry

Ion Beam ◽

Argon Gas ◽

X Ray ◽

Practical Applications ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Practical Application of Argon Gas Cluster Ion Beam in X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Journal of the Japan Society for Precision Engineering ◽

10.2493/jjspe.82.320 ◽

2016 ◽

Vol 82 (4) ◽

pp. 320-324

Author(s):

Takuya MIYAYAMA

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Practical Application ◽

Argon Gas ◽

X Ray ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

Surface and Interface Analysis ◽

10.1002/sia.5518 ◽

2014 ◽

Vol 46 (12-13) ◽

pp. 1129-1132

Author(s):

Makiko Fujii ◽

Shunichirou Nakagawa ◽

Toshio Seki ◽

Takaaki Aoki ◽

Jiro Matsuo

Keyword(s):

Mass Spectrometry ◽

Quantitative Analysis ◽

Ion Beam ◽

Argon Gas ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.6867 ◽

2014 ◽

Vol 28 (8) ◽

pp. 917-920 ◽

Cited By ~ 10

Author(s):

Makiko Fujii ◽

Shunichirou Nakagawa ◽

Kazuhiro Matsuda ◽

Naoki Man ◽

Toshio Seki ◽

...

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Detection Limits ◽

Argon Gas ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry

Scientific Reports ◽

10.1038/srep10000 ◽

2015 ◽

Vol 5 (1) ◽

Cited By ~ 4

Author(s):

Noritaka Masaki ◽

Itsuko Ishizaki ◽

Takahiro Hayasaka ◽

Gregory L. Fisher ◽

Noriaki Sanada ◽

...

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Three Dimensional ◽

Time Of Flight ◽

Dimensional Image ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling

10.1116/1.5024044 ◽

2018 ◽

Vol 36 (3) ◽

pp. 03E105

Author(s):

Michaeleen L. Pacholski ◽

Zhaohui Qu ◽

Wuye Ouyang ◽

Zhibo Zheng ◽

Rong Wang

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Latex Films ◽

Chemical Oscillation ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Dose-dependent cesium ion beam damage effects on chemically modified poly(methyl methacrylate) films using secondary ion mass spectrometry and x-ray photoelectron spectroscopy

Analytical Chemistry ◽

10.1021/ac00279a035 ◽

1985 ◽

Vol 57 (1) ◽

pp. 137-142 ◽

Cited By ~ 21

Author(s):

S. J. Simko ◽

D. P. Griffis ◽

R. W. Murray ◽

R. W. Linton

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

X Ray ◽

Chemically Modified ◽

Cesium Ion ◽

Dose Dependent ◽

Secondary Ion ◽

Beam Damage

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

Journal of Applied Physics ◽

10.1063/1.4823815 ◽

2013 ◽

Vol 114 (12) ◽

pp. 124313 ◽

Cited By ~ 30

Author(s):

Peter J. Cumpson ◽

Jose F. Portoles ◽

Anders J. Barlow ◽

Naoko Sano

Keyword(s):

Mass Spectrometry ◽

Depth Profiling ◽

X Ray ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Exploiting the Semidestructive Nature of Gas Cluster Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Imaging for Simultaneous Localization and Confident Lipid Annotations

Analytical Chemistry ◽

10.1021/acs.analchem.9b03763 ◽

2019 ◽

Vol 91 (23) ◽

pp. 15073-15080 ◽

Cited By ~ 6

Author(s):

Tina B. Angerer ◽

Dusan Velickovic ◽

Carrie D. Nicora ◽

Jennifer E. Kyle ◽

Daniel J. Graham ◽

...

Keyword(s):

Mass Spectrometry ◽

Mass Spectrometry Imaging ◽

Ion Beam ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Gas Cluster Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry High-Resolution Imaging of Cardiolipin Speciation in the Brain: Identification of Molecular Losses after Traumatic Injury

Analytical Chemistry ◽

10.1021/acs.analchem.7b00164 ◽

2017 ◽

Vol 89 (8) ◽

pp. 4611-4619 ◽

Cited By ~ 48

Author(s):

Hua Tian ◽

Louis J. Sparvero ◽

Andrew A. Amoscato ◽

Anna Bloom ◽

Hülya Bayır ◽

...

Keyword(s):

Mass Spectrometry ◽

Ion Beam ◽

Traumatic Injury ◽

High Resolution Imaging ◽

Cluster Ion ◽

Resolution Imaging ◽

Gas Cluster Ion Beam ◽

The Brain ◽

Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM

ACS Applied Materials & Interfaces ◽

10.1021/acsami.5b09261 ◽

2015 ◽

Vol 7 (50) ◽

pp. 27853-27862 ◽

Cited By ~ 17

Author(s):

Arnaud Bordes ◽

Eric De Vito ◽

Cédric Haon ◽

Christophe Secouard ◽

Alexandre Montani ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Focused Ion Beam ◽

Ion Beam ◽

Lithium Insertion ◽

X Ray ◽

Coupling Time ◽