scholarly journals A method for improvement of mass resolution and isotope accuracy for laser ablation time-of-flight mass spectrometers

2018 ◽  
Vol 33 (1) ◽  
pp. e3081 ◽  
Author(s):  
Reto Wiesendanger ◽  
Marek Tulej ◽  
Valentine Grimaudo ◽  
Alena Cedeño-López ◽  
Rustam Lukmanov ◽  
...  

1998 ◽  
Vol 66 (1) ◽  
pp. 99-102 ◽  
Author(s):  
C. Xu ◽  
Y. Long ◽  
R. Zhang ◽  
L. Zhao ◽  
S. Qian ◽  
...  




2018 ◽  
Vol 33 (11) ◽  
pp. 1892-1902 ◽  
Author(s):  
Anne-Laure Ronzani ◽  
Fabien Pointurier ◽  
Martin Rittner ◽  
Olga Borovinskaya ◽  
Martin Tanner ◽  
...  

Isotopic compositions of individual uranium micrometric particles are measured precisely by means of laser ablation – time of flight ICP-MS coupling.



2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Ravi Mawale ◽  
Govinda Mandal ◽  
Marek Bouška ◽  
Jan Gutwirth ◽  
Pankaj Lochan Bora ◽  
...  

AbstractThe Ge-Bi-Se thin films of varied compositions (Ge content 0–32.1 at. %, Bi content 0–45.7 at. %, Se content 54.3–67.9 at. %) have been prepared by rf magnetron (co)-sputtering technique. The present study was undertaken in order to investigate the clusters generated during the interaction of laser pulses with Ge-Bi-Se thin films using laser ablation time-of-flight mass spectrometry. The stoichiometry of the clusters was determined in order to understand the individual species present in the plasma plume. Laser ablation of Ge-Bi-Se thin films accompanied by ionization produces about 20 positively and/or negatively charged unary, binary and ternary (Gex+, Biy+, Sez+/−, GexSez+/−, BiySez+/− and GexBiySez−) clusters. Furthermore, we performed the laser ablation experiments of Ge:Bi:Se elemental mixtures and the results were compared with laser ablation time-of-flight mass spectrometry analysis of thin films. Moreover, to understand the geometry of the generated clusters, we calculated structures of some selected binary and ternary clusters using density functional theory. The generated clusters and their calculated possible geometries can give important structural information, as well as help to understand the processes present in the plasma processes exploited for thin films deposition.





Laser Physics ◽  
2017 ◽  
Vol 28 (1) ◽  
pp. 016002 ◽  
Author(s):  
Nasar Ahmed ◽  
M Abdullah ◽  
Rizwan Ahmed ◽  
N K Piracha ◽  
M Aslam Baig


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