Three national cancer clinical research groups to merge

I have argued that notwithstanding considerable research activity in developmental phonological disorders, the basic questions remain unanswered. I have proposed that a central problem with the research culture in child phonology is that it includes too little cross-laboratory collaboration of the type seen when significant breakthroughs are reported in other biological and social sciences. Finally, I have suggested the need for a shared classification system for developmental phonological disorders—to promote cross-laboratory research, as well as to strengthen the efforts of individual clinical research groups. As stressed by one of my teachers, Ralph Shelton, collaboration is a cornerstone of scholarship. I am optimistic that our discipline will evolve toward a productive 21st century marked by vital, collaborative scholarship.

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Fundamental Research into Thin Films in a Developing Country

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100095753 ◽

1972 ◽

Vol 30 ◽

pp. 500-501

Author(s):

J.A. Eades ◽

E. Grünbaum

Keyword(s):

Thin Films ◽

Growth Process ◽

Empirical Process ◽

Nucleation And Growth ◽

Research Groups ◽

Film Research ◽

Fundamental Research ◽

Controlled Deposition ◽

The One ◽

The University

In the last decade and a half, thin film research, particularly research into problems associated with epitaxy, has developed from a simple empirical process of determining the conditions for epitaxy into a complex analytical and experimental study of the nucleation and growth process on the one hand and a technology of very great importance on the other. During this period the thin films group of the University of Chile has studied the epitaxy of metals on metal and insulating substrates. The development of the group, one of the first research groups in physics to be established in the country, has parallelled the increasing complexity of the field.The elaborate techniques and equipment now needed for research into thin films may be illustrated by considering the plant and facilities of this group as characteristic of a good system for the controlled deposition and study of thin films.

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Atomic-level imaging of the surface structure of Ag2O

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100113160 ◽

1984 ◽

Vol 42 ◽

pp. 656-657

Author(s):

William Krakow

Keyword(s):

High Vacuum ◽

Atomic Level ◽

Ultra High Vacuum ◽

Research Groups ◽

Resolution Electron ◽

Surface Reconstructions ◽

Order Of Magnitude ◽

High Resolution Electron Microscope ◽

Saturated Structure ◽

Transmission And Reflection

In recent years electron microscopy has been used to image surfaces in both the transmission and reflection modes by many research groups. Some of this work has been performed under ultra high vacuum conditions (UHV) and apparent surface reconstructions observed. The level of resolution generally has been at least an order of magnitude worse than is necessary to visualize atoms directly and therefore the detailed atomic rearrangements of the surface are not known. The present author has achieved atomic level resolution under normal vacuum conditions of various Au surfaces. Unfortunately these samples were exposed to atmosphere and could not be cleaned in a standard high resolution electron microscope. The result obtained surfaces which were impurity stabilized and reveal the bulk lattice (1x1) type surface structures also encountered by other surface physics techniques under impure or overlayer contaminant conditions. It was therefore decided to study a system where exposure to air was unimportant by using a oxygen saturated structure, Ag2O, and seeking to find surface reconstructions, which will now be described.

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Quantitative parallel EELS spectrum imaging developed as a new tool in AEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010013064x ◽

1992 ◽

Vol 50 (2) ◽

pp. 1202-1203

Author(s):

Gianluigi Botton ◽

Gilles L'espérance

Keyword(s):

Statistical Analysis ◽

Spatial Resolution ◽

Personal Computer ◽

Systematic Study ◽

Present Author ◽

Chemical Elements ◽

Detection Limits ◽

Research Groups ◽

Quantitative Performance ◽

Spectrum Imaging

As interest for parallel EELS spectrum imaging grows in laboratories equipped with commercial spectrometers, different approaches were used in recent years by a few research groups in the development of the technique of spectrum imaging as reported in the literature. Either by controlling, with a personal computer both the microsope and the spectrometer or using more powerful workstations interfaced to conventional multichannel analysers with commercially available programs to control the microscope and the spectrometer, spectrum images can now be obtained. Work on the limits of the technique, in terms of the quantitative performance was reported, however, by the present author where a systematic study of artifacts detection limits, statistical errors as a function of desired spatial resolution and range of chemical elements to be studied in a map was carried out The aim of the present paper is to show an application of quantitative parallel EELS spectrum imaging where statistical analysis is performed at each pixel and interpretation is carried out using criteria established from the statistical analysis and variations in composition are analyzed with the help of information retreived from t/γ maps so that artifacts are avoided.

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