Accurate determination of polyethylene pellet density using transmission Raman spectroscopy

2011 ◽  
Vol 42 (11) ◽  
pp. 1967-1976 ◽  
Author(s):  
Mooeung Kim ◽  
Hoeil Chung ◽  
Young Mee Jung
PLoS ONE ◽  
2012 ◽  
Vol 7 (2) ◽  
pp. e32406 ◽  
Author(s):  
Narahara Chari Dingari ◽  
Gary L. Horowitz ◽  
Jeon Woong Kang ◽  
Ramachandra R. Dasari ◽  
Ishan Barman

2017 ◽  
Vol 71 (8) ◽  
pp. 1849-1855 ◽  
Author(s):  
Martha Z. Vardaki ◽  
Hannah Sheridan ◽  
Nicholas Stone ◽  
Pavel Matousek

Carbon ◽  
2017 ◽  
Vol 114 ◽  
pp. 141-159 ◽  
Author(s):  
D.I. Levshov ◽  
H.N. Tran ◽  
M. Paillet ◽  
R. Arenal ◽  
X.T. Than ◽  
...  

2017 ◽  
Vol 81 (6) ◽  
pp. 1439-1456 ◽  
Author(s):  
A. I. Apopei ◽  
G. Damian ◽  
N. Buzgar ◽  
A. Buzatu ◽  
P. Andráš ◽  
...  

AbstractNatural samples containing tetrahedrite–tennantite, bournonite–seligmannite and geocronite–jordanite from the Coranda-Hondol ore deposit, Romania, were investigated by Raman spectroscopy to determine its capability to provide estimates of solid solutions in three common and widespread sulfosalt mineral series. Raman measurements were performed on extended solid solution series (Td1 to Td97, Bnn25 to Bnn93 and Gcn24 to Gcn67, apfu). The tetrahedrite–tennantite and bournonite–seligmannite solid solution series show strong correlations between spectroscopic parameters ( position, relative intensity and shape of the Raman bands) and the Sb/(Sb+As) content ratio, while Raman spectra of geocronite–jordanite shows no evolution of Raman bands. In order to simplify the method used to estimate the Sb/(Sb+As) content ratio in tetrahedrite–tennantite and bournonite–seligmannite series, several linear equations of the first-order polynomial fit were obtained. The results are in good agreement with electron microprobe data. Moreover, a computer program was developed as an analytical tool for a fast and accurate determination of Sb/(Sb+As) content ratio by at least one spectroscopic parameter. These results indicate that Raman spectroscopy can provide direct information on the composition and structure of the tetrahedrite–tennantite and bournonite– seligmannite series.


2019 ◽  
Vol 91 (14) ◽  
pp. 8994-9000 ◽  
Author(s):  
Sara Mosca ◽  
Priyanka Dey ◽  
Tanveer A. Tabish ◽  
Francesca Palombo ◽  
Nicholas Stone ◽  
...  

Food Control ◽  
2015 ◽  
Vol 52 ◽  
pp. 119-125 ◽  
Author(s):  
Daniel T. Berhe ◽  
Anders J. Lawaetz ◽  
Søren B. Engelsen ◽  
Marchen S. Hviid ◽  
René Lametsch

2003 ◽  
Vol 799 ◽  
Author(s):  
James E. Maslar ◽  
Wilbur S. Hurst ◽  
Christine A. Wang ◽  
Daniel A. Shiau

ABSTRACTGaSb-based semiconductors are of interest for mid-infrared optoelectronic and high-speed electronic devices. Accurate determination of electrical properties is essential for optimizing the performance of these devices. However, electrical characterization of these semiconductors is not straightforward since semi-insulating (SI) GaSb substrates for Hall measurements are not available. In this work, the capability of Raman spectroscopy for determination of the majority carrier concentration in n-GaInAsSb epilayers was investigated. Raman spectroscopy offers the advantage of being non-contact and spatially resolved. Furthermore, the type of substrate used for the epilayer does not affect the measurement. However, for antimonide-based materials, traditionally employed Raman laser sources and detectors are not optimized for the analysis wavelength range dictated by the narrow band gap of these materials. Therefore, a near-infrared Raman spectroscopic system, optimized for antimonide-based materials, was developed.Ga0.85In0.15As0.13Sb0.87 epilayers were grown by organometallic vapor phase epitaxy with doping levels in the range 2 to 80 × 1017 cm-3, as measured by secondary ion mass spectrometry. For a particular nominal doping level, epilayers were grown both lattice matched to n-GaSb substrates and lattice-mismatched to SI GaAs substrates under nominally identical conditions. Single magnetic field Hall measurements were performed on the epilayers grown on SI GaAs substrates, while Raman spectroscopy was used to measure the carrier concentration of epilayers grown on GaSb and the corresponding SI GaAs substrates. Contrary to Hall measurements, Raman spectra indicated that the GaInAsSb epilayers grown on GaSb substrates have higher free carrier concentrations than the corresponding epilayers grown on SI GaAs substrates under nominally identical conditions. This is contrary to the assumption that for nominally identical growth conditions, the resulting carrier concentration is independent of substrate, and possible mechanisms will be discussed.


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