Yield stress and rheological characterization of the low shear zone of an epoxy molding compound for encapsulation of semiconductor devices
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2012 ◽
Vol 52
(8)
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pp. 1711-1718
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2001 ◽
Vol 146-147
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pp. 331-337
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2012 ◽
Vol 41
(9)
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pp. 2599-2605
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