Plasma Etching and Roughening of Thin Polymeric Films: A Fast, Accurate, in situ Method of Surface Roughness Measurement

2008 ◽  
Vol 5 (9) ◽  
pp. 825-833 ◽  
Author(s):  
George Kokkoris ◽  
Nikolaos Vourdas ◽  
Evangelos Gogolides
2017 ◽  
Vol 137 (3) ◽  
pp. 147-152 ◽  
Author(s):  
Tetsuo Fukuchi ◽  
Norikazu Fuse ◽  
Mitsutoshi Okada ◽  
Tomoharu Fujii ◽  
Maya Mizuno ◽  
...  

2013 ◽  
Vol 465-466 ◽  
pp. 764-768 ◽  
Author(s):  
Tanel Aruväli ◽  
Tauno Otto

The paper investigates in-process signal usage in turning for indirect surface roughness measurement. Based on theoretical surface roughness value and in-process signal, a model is proposed for surface roughness evaluation. Time surface roughness and in-process signal surface roughness correlation based analysis is performed to characterize tool wear component behavior among others. Influencing parameters are grouped based on their behavior in time. Moreover, Digital Object Memory based solution and algorithm is proposed to automate indirect surface roughness measurement process.


Sensors ◽  
2013 ◽  
Vol 13 (9) ◽  
pp. 11772-11781 ◽  
Author(s):  
Félix Salazar ◽  
Alberto Barrientos

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