The Ion Charge Fluctuation Effect on Impurity Depth Distributions for High-Energy Ion Implantation. The Backward Transport Equation-Based Simulation
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1992 ◽
Vol 67
(1-4)
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pp. 35-38
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1995 ◽
Vol 95
(1)
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pp. 17-24
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1995 ◽
Vol 29
(1-3)
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pp. 202-205
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1997 ◽
Vol 127-128
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pp. 388-392
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