Evaluation of the Use of Sputter Profiling with XPS or AES for the Study of Surface Carburization Resulting from High Energy (>20 keV) Ion Implantation

1983 ◽  
Author(s):  
C. R. Clayton
Keyword(s):  
2003 ◽  
Vol 22 (4) ◽  
pp. 225-237
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K. J. GRANT ◽  
ROBERTS A. ◽  
D. N. JAMIESON ◽  
B. ROUT ◽  
C. CHER

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Ueno Keiji ◽  
Matsumoto Yasuyo ◽  
Nishimiya Nobuyuki ◽  
Noshiro Mitsuru ◽  
Satou Mamoru
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Vacuum ◽  
1992 ◽  
Vol 43 (5-7) ◽  
pp. 699-701 ◽  
Author(s):  
L Ya Alimova ◽  
IE Djamaletdinova ◽  
TS Pugacheva ◽  
IE Ilicheva

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E.P Neustroev ◽  
I.V Antonova ◽  
V.I Obodnikov ◽  
V.P Popov ◽  
V.A Skuratov ◽  
...  

1993 ◽  
Vol 32 (Part 1, No. 1B) ◽  
pp. 303-307 ◽  
Author(s):  
Takashi Kuroi ◽  
Youji Kawasaki ◽  
Shigeki Komori ◽  
Kouji Fukumoto ◽  
Masahide Inuishi ◽  
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2009 ◽  
Vol 389 (2) ◽  
pp. 248-253 ◽  
Author(s):  
M.P. Carroll ◽  
K. Stephenson ◽  
K.O. Findley
Keyword(s):  

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