Kelvin-probe studies of n-conductive organic field-effect transistors during operation

2010 ◽  
Vol 7 (2) ◽  
pp. 452-455 ◽  
Author(s):  
Franziska Lüttich ◽  
Daniel Lehmann ◽  
Harald Graaf ◽  
Dietrich R. T. Zahn ◽  
Christian von Borczyskowski
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Organic Field Effect Transistors ◽  
Kelvin Probe

A new method to invert top-gate organic field-effect transistors for Kelvin probe investigations

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D. Walker ◽  
C. Melzer ◽  
...  
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Field Effect ◽  
Field Effect Transistors ◽  
New Method ◽  
Organic Field Effect Transistors ◽  
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S. Nicht ◽  
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Field Effect ◽  
Field Effect Transistors ◽  
Kelvin Probe Force Microscopy ◽  
Organic Field Effect Transistors ◽  
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scholarly journals Scanning Kelvin probe microscopy on organic field-effect transistors during gate bias stress

2007 ◽  
Vol 90 (19) ◽  
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Author(s):  
S. G. J. Mathijssen ◽  
M. Cölle ◽  
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M. Kemerink ◽  
P. A. Bobbert ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Gate Bias ◽  
Organic Field Effect Transistors ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Bias Stress ◽  
Scanning Kelvin Probe ◽  
Gate Bias Stress

scholarly journals Effect of contact resistance in organic field‐effect transistors

Nano Select ◽  
2021 ◽  
Author(s):  
Yanjun Shi ◽  
Jie Liu ◽  
Yuanyuan Hu ◽  
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Lang Jiang
Keyword(s):  
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Field Effect Transistors ◽  
Organic Field Effect Transistors
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