Oxygen-related defects: minority carrier lifetime killers in n-type Czochralski silicon wafers for solar cell application

2015 ◽  
Vol 12 (8) ◽  
pp. 1108-1110 ◽  
Author(s):  
I. Kolevatov ◽  
V. Osinniy ◽  
M. Herms ◽  
A. Loshachenko ◽  
I. Shlyakhov ◽  
...  
Keyword(s):  
Solar Cell ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Silicon Wafers ◽  
Solar Cell Application ◽  
Czochralski Silicon

Minority‐carrier lifetime of magnetic field applied Czochralski silicon wafers

1988 ◽  
Vol 53 (19) ◽  
pp. 1850-1852 ◽  
Author(s):  
T. Higuchi ◽  
E. Gaylord ◽  
G. A. Rozgonyi ◽  
F. Shimura
Keyword(s):  
Magnetic Field ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Silicon Wafers ◽  
Czochralski Silicon

Minority Carrier Lifetime in Czochralski Silicon Containing Oxide Precipitates

2019 ◽  
Vol 33 (11) ◽  
pp. 121-132 ◽  
Author(s):  
John D. Murphy ◽  
Karsten Bothe ◽  
Massimiliano Olmo ◽  
Vladimir V. Voronkov ◽  
Robert J. Falster
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Czochralski Silicon

Improvement of Minority Carrier Lifetime and Si Solar Cell Characteristics by Nitric Acid Oxidation Method

2014 ◽  
Vol 3 (7) ◽  
pp. Q137-Q141 ◽  
Author(s):  
Fumio Shibata ◽  
Daisuke Ishibashi ◽  
Shoji Ogawara ◽  
Taketoshi Matsumoto ◽  
Chang-Ho Kim ◽  
...  
Keyword(s):  
Solar Cell ◽  
Nitric Acid ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Acid Oxidation ◽  
Oxidation Method ◽  
Si Solar Cell ◽  
Nitric Acid Oxidation

Minority carrier lifetime scan map in crystalline silicon wafers

1999 ◽  
Vol 70 (10) ◽  
pp. 4044-4046 ◽  
Author(s):  
J. Gervais ◽  
O. Palais ◽  
L. Clerc ◽  
S. Martinuzzi
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Crystalline Silicon ◽  
Minority Carrier Lifetime ◽  
Silicon Wafers
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