Atomic/molecular depth profiling of nanometric-metallized polymer thin films by secondary ion mass spectrometry

2010 ◽  
Vol 24 (4) ◽  
pp. 463-468 ◽  
Author(s):  
Helena Téllez ◽  
José Miguel Vadillo ◽  
José Javier Laserna
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Secondary Ion Mass Spectrometry ◽  
Polymer Thin Films ◽  
Depth Profiling ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Secondary Ion ◽  
Metallized Polymer

Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

2018 ◽  
Vol 11 (1) ◽  
pp. 29-48 ◽  
Author(s):  
Nicholas Winograd
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Ion Beams ◽  
High Yield ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Secondary Ion

Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of clusters containing thousands of particles, initiate desorption of target molecules with high yield and minimal fragmentation. This review emphasizes the unique opportunities for implementing these sources, especially for bioimaging applications. Theoretical aspects of the cluster ion/solid interaction are developed to maximize conditions for successful mass spectrometry. In addition, the history of how GCIBs have become practical laboratory tools is reviewed. Special emphasis is placed on the versatility of these sources, as size, kinetic energy, and chemical composition can be varied easily to maximize lateral resolution, hopefully to less than 1 micron, and to maximize ionization efficiency. Recent examples of bioimaging applications are also presented.

scholarly journals 3-D Molecular Depth Profiling of Biological and Polymeric Materials Using Time-of-Flight Secondary Ion Mass Spectrometry

2013 ◽  
Vol 19 (S2) ◽  
pp. 664-665
Author(s):  
P.A. Clark ◽  
E. Tallarek ◽  
D. Breitenstein ◽  
B. Hagenhoff ◽  
N. Havercroft
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Polymeric Materials ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Secondary Ion

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Sign in / Sign up

Export Citation Format

Share Document