Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O2+ ion bombardment

Time Of Flight ◽

Depth Profiling ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

Investigating Pb diffusion across buried interfaces in Pb(Zr0.2 Ti0.8 )O3 thin films via time-of-flight secondary ion mass spectrometry depth profiling

10.1002/sia.6255 ◽

2017 ◽

Vol 49 (10) ◽

pp. 973-977 ◽

Cited By ~ 3

Author(s):

John S. Mangum ◽

Stephen Podowitz-Thomas ◽

Jason Nikkel ◽

Chuanzhen Zhou ◽

Jacob L. Jones

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Time Of Flight ◽

Depth Profiling ◽

Buried Interfaces ◽

Ion Mass Spectrometry ◽

Are cluster ion analysis beams good choices for hydrogen depth profiling using time-of-flight secondary ion mass spectrometry?

10.1002/sia.3776 ◽

2011 ◽

Vol 44 (1) ◽

pp. 89-93 ◽

Cited By ~ 10

Author(s):

Zihua Zhu ◽

Vaithiyalingam Shutthanandan

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Secondary Ion ◽

Ion Analysis

Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry

Thin Solid Films ◽

10.1016/j.tsf.2011.04.018 ◽

2011 ◽

Vol 519 (18) ◽

pp. 6183-6189 ◽

Cited By ~ 4

Author(s):

Karl E. Mayerhofer ◽

Jakob Heier ◽

Ylenia Maniglio ◽

Beat Andreas Keller

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Dimensional Analysis ◽

Three Dimensional ◽

Time Of Flight ◽

Organic Thin Films ◽

Ion Mass Spectrometry ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Time-of-flight secondary ion mass spectrometry depth profiling of multiple quantum well II–VI semiconductors using negative cluster ions

10.1116/1.590543 ◽

1999 ◽

Vol 17 (1) ◽

pp. 224 ◽

Cited By ~ 2

Author(s):

Jin Zhao ◽

Myunghee Na ◽

Patrick J. McKeown ◽

Huicheng Chang ◽

Eunhwa Lee ◽

...

Keyword(s):

Mass Spectrometry ◽

Quantum Well ◽

Multiple Quantum Well ◽

Time Of Flight ◽

Depth Profiling ◽

Cluster Ions ◽

Multiple Quantum ◽

Ion Mass Spectrometry ◽

Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions?

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.2446 ◽

2006 ◽

Vol 20 (8) ◽

pp. 1327-1334 ◽

Cited By ~ 53

Author(s):

Xavier A. Conlan ◽

Nicholas P. Lockyer ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Aqueous Solutions ◽

Time Of Flight ◽

Ion Bombardment ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Angewandte Chemie International Edition in English ◽

10.1002/anie.199410231 ◽

1994 ◽

Vol 33 (10) ◽

pp. 1023-1043 ◽

Cited By ~ 329

Author(s):

Alfred Benninghoven

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Chemical Analysis ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Organic Surfaces ◽

Secondary Ion ◽

Inorganic And Organic

Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time-of-flight secondary ion mass spectrometry. 1. Effect of main chain and pendant methyl groups

10.1002/sia.2006 ◽

2005 ◽

Vol 37 (1) ◽

pp. 42-52 ◽

Cited By ~ 14

Author(s):

M. S. Wagner

Keyword(s):

Mass Spectrometry ◽

Main Chain ◽

Time Of Flight ◽

Ion Bombardment ◽

Methyl Groups ◽

Ion Mass Spectrometry ◽

Nanoconfinement of Ionic Liquid and Polymers in Supported Thin Films: A Time-of-Flight Secondary Ion Mass Spectrometry Study of Surface Diffusion

The Journal of Physical Chemistry C ◽

10.1021/jp404816t ◽

2013 ◽

Vol 117 (41) ◽

pp. 21281-21287 ◽

Cited By ~ 2

Author(s):

Ryutaro Souda

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Ionic Liquid ◽

Surface Diffusion ◽

Time Of Flight ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Quantitative depth profiling of Si1–xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry

Thin Solid Films ◽

10.1016/j.tsf.2016.03.049 ◽

2016 ◽

Vol 607 ◽

pp. 25-31 ◽

Cited By ~ 3

Author(s):

M.N. Drozdov ◽

Y.N. Drozdov ◽

A. Csik ◽

A.V. Novikov ◽

K. Vad ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time-of-flight secondary ion mass spectrometry. 2. Poly(n-alkyl methacrylates)

10.1002/sia.2007 ◽

2005 ◽

Vol 37 (1) ◽

pp. 53-61 ◽

Cited By ~ 9

Author(s):

M. S. Wagner

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Alkyl Methacrylates