P‐36: Highly Reliable a‐IGZO TFT Gate Driver Circuit to Prevent Leakage Path in Depletion Mode Operation

2020 ◽  
Vol 51 (1) ◽  
pp. 1486-1489
Author(s):  
Jungwoo Lee ◽  
Jongsu Oh ◽  
Eun Kyo Jung ◽  
KeeChan Park ◽  
Soo-Yeon Lee ◽  
...  
2019 ◽  
Vol 7 ◽  
pp. 309-314 ◽  
Author(s):  
Jin-Ho Kim ◽  
Jongsu Oh ◽  
Keechan Park ◽  
Jae-Hong Jeon ◽  
Yong-Sang Kim

Author(s):  
Yan Xue ◽  
Bai-Xiang Han ◽  
Gary Chaw ◽  
Cong-Wei Liao ◽  
Sheng-Dong Zhang ◽  
...  

2019 ◽  
Vol 50 (1) ◽  
pp. 196-198
Author(s):  
In June Kim ◽  
Seok Noh ◽  
Myung Ho Ban ◽  
Ki Min Son ◽  
In Hyo Han ◽  
...  

Displays ◽  
2018 ◽  
Vol 53 ◽  
pp. 1-7 ◽  
Author(s):  
Jin-Ho Kim ◽  
Jongsu Oh ◽  
KeeChan Park ◽  
Yong-Sang Kim

2019 ◽  
Vol 27 (5) ◽  
pp. 313-318
Author(s):  
In June Kim ◽  
Seok Noh ◽  
Myung Ho Ban ◽  
Kimin Son ◽  
Inhyo Han ◽  
...  

Author(s):  
Jungwoo Lee ◽  
Jongsu Oh ◽  
Eun Kyo Jung ◽  
KeeChan Park ◽  
Jae-Hong Jeon ◽  
...  

Author(s):  
Yan Xue ◽  
Kai Liu ◽  
Longjie Wang ◽  
Yu Zhang ◽  
Yuzhi Zheng ◽  
...  
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document