8‐3:
Invited Paper:
Back‐Channel Defect Termination for p‐Channel Oxide‐TFTs
Keyword(s):
Keyword(s):
2017 ◽
Vol 64
(10)
◽
pp. 4131-4136
◽
2018 ◽
Vol 65
(11)
◽
pp. 4861-4867
◽
Keyword(s):
2018 ◽
Vol 6
◽
pp. 680-684
◽