SIMS depth profile analysis of particles collected in an urban environment

Surface and Interface Analysis ◽

10.1002/sia.3666 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 470-474 ◽

Author(s):

P. Konarski ◽

K. Kaczorek ◽

B. Balcerzak ◽

J. Haluszka ◽

M. Scibor ◽

...

Keyword(s):

Urban Environment ◽

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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Comparative XPS and SIMS depth profile analysis of Cu-implanted silicon: evidence of segregation effects

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(90)90605-t ◽

1990 ◽

Vol 52 (1) ◽

pp. 79-82 ◽

Author(s):

E. Darque-Ceretti ◽

M. Aucouturier

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis for investigations of the lithium-diffusion in hydrogenated amorphous silicon

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00321389 ◽

1993 ◽

Vol 346 (1-3) ◽

pp. 92-95 ◽

Author(s):

U. Zastrow ◽

W. Beyer ◽

J. Herion

Keyword(s):

Amorphous Silicon ◽

Depth Profile ◽

Profile Analysis ◽

Hydrogenated Amorphous Silicon ◽

Depth Profile Analysis ◽

Lithium Diffusion ◽

Hydrogenated Amorphous ◽

Sims Depth Profile

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Cold plasma cleaning of copper and aluminum tested by SIMS depth profile analysis

Surface and Interface Analysis ◽

10.1002/sia.3655 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 612-617 ◽

Author(s):

P. Konarski ◽

T. Opalińska

Keyword(s):

Depth Profile ◽

Cold Plasma ◽

Profile Analysis ◽

Plasma Cleaning ◽

Depth Profile Analysis ◽

Sims Depth Profile

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Ion beam shadowing effects in SIMS depth profile analysis of MBE-grown nanostructures

Vacuum ◽

10.1016/j.vacuum.2005.01.041 ◽

2005 ◽

Vol 78 (2-4) ◽

pp. 291-295 ◽

Author(s):

M. Ćwil ◽

P. Konarski

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Ion Beam ◽

Depth Profile Analysis ◽

Shadowing Effects ◽

Sims Depth Profile

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Application of ‘Storing Matter’ technique in SIMS depth profile analysis

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2018.05.017 ◽

2019 ◽

Vol 450 ◽

pp. 153-156 ◽

Author(s):

M. Miśnik ◽

P. Konarski ◽

A. Zawada ◽

J. Ażgin

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis of sodium in silicon dioxide

Applied Surface Science ◽

10.1016/j.apsusc.2008.05.069 ◽

2008 ◽

Vol 255 (4) ◽

pp. 860-862 ◽

Author(s):

Y. Yamamoto ◽

N. Shimodaira

Keyword(s):

Silicon Dioxide ◽

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis of tribological coatings on curved surfaces: Influence of ion impact angle and take‐off angle on ion yield and on the quantitative analysis of chemical composition

Surface and Interface Analysis ◽

10.1002/sia.6641 ◽

2019 ◽

Vol 51 (7) ◽

pp. 703-711

Author(s):

Kirsten Ingolf Schiffmann

Keyword(s):

Quantitative Analysis ◽

Chemical Composition ◽

Depth Profile ◽

Profile Analysis ◽

Impact Angle ◽

Curved Surfaces ◽

Depth Profile Analysis ◽

Tribological Coatings ◽

Sims Depth Profile

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Transient effects in SIMS depth profile analysis of 1 keV as implanted Si

2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) ◽

10.1109/iit.2000.924244 ◽

2003 ◽

Author(s):

P.A.W. Van Der Heide ◽

J.W. Rabalais ◽

A. Al-Bayati

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Transient Effects ◽

Depth Profile Analysis ◽

Sims Depth Profile

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Ion sputtering of microparticles in SIMS depth profile analysis

Vacuum ◽

10.1016/s0042-207x(01)00258-5 ◽

2001 ◽

Vol 63 (4) ◽

pp. 685-689 ◽

Author(s):

Piotr Konarski ◽

Iwonna Iwanejko ◽

Agnieszka Mierzejewska ◽

Artur Wymysłowski

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Ion Sputtering ◽

Depth Profile Analysis ◽

Sims Depth Profile

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SIMS depth profile analysis using MCs+ molecular ions

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00322106 ◽

1991 ◽

Vol 341 (1-2) ◽

pp. 54-56 ◽

Author(s):

H. Gnaser ◽

H. Oechsner

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Molecular Ions ◽

Depth Profile Analysis ◽

Sims Depth Profile

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