scholarly journals Cover Picture: Nanometer-Scale Modification and Welding of Silicon and Metallic Nanowires with a High-Intensity Electron Beam (Small 12/2005)

Small ◽  
2005 ◽  
Vol 1 (12) ◽  
pp. 1133-1133
Author(s):  
Shengyong Xu ◽  
Mingliang Tian ◽  
Jinguo Wang ◽  
Jian Xu ◽  
Joan M. Redwing ◽  
...  
Small ◽  
2005 ◽  
Vol 1 (12) ◽  
pp. 1221-1229 ◽  
Author(s):  
Shengyong Xu ◽  
Mingliang Tian ◽  
Jinguo Wang ◽  
Jian Xu ◽  
Joan M. Redwing ◽  
...  

Author(s):  
George Christov ◽  
Bolivar J. Lloyd

A new high intensity grid cap has been designed for the RCA-EMU-3 electron microscope. Various parameters of the new grid cap were investigated to determine its characteristics. The increase in illumination produced provides ease of focusing on the fluorescent screen at magnifications from 1500 to 50,000 times using an accelerating voltage of 50 KV.The EMU-3 type electron gun assembly consists of a V-shaped tungsten filament for a cathode with a thin metal threaded cathode shield and an anode with a central aperture to permit the beam to course the length of the column. The cathode shield is negatively biased at a potential of several hundred volts with respect to the filament. The electron beam is formed by electrons emitted from the tip of the filament which pass through an aperture of 0.1 inch diameter in the cap and then it is accelerated by the negative high voltage through a 0.625 inch diameter aperture in the anode which is at ground potential.


1975 ◽  
Vol 14 (9) ◽  
pp. 1413-1414
Author(s):  
Masaru Masuzaki ◽  
Akihiro Mohri ◽  
Tetsuya Tsuzuki ◽  
Kazunari Ikuta

Author(s):  
S. V. Raykov ◽  
E. V. Kapralov ◽  
E. S. Vashchuk ◽  
E. A. Budovskikh ◽  
V. E. Gromov ◽  
...  

2021 ◽  
Vol 22 (1) ◽  
pp. 129-157
Author(s):  
D. V. Zaguliaev ◽  
S. V. Konovalov ◽  
Yu. F. Ivanov ◽  
V. E. Gromov ◽  
V. V. Shlyarov ◽  
...  

The study deals with the element–phase composition, microstructure evolution, crystal-lattice parameter, and microdistortions as well as the size of the coherent scattering region in the Al–10.65Si–2.11Cu and Al–5.39Si–1.33Cu alloys irradiated with the high-intensity electron beam. As revealed by the methods of x-ray phase analysis, the principal phases in untreated alloys are the aluminium-based solid solution, silicon, intermetallics, and Fe2Al9Si2 phase. In addition, the Cu9Al4 phase is detected in Al–10.65Si–2.11Cu alloy. Processing alloys with the pulsed electron beam induces the transformation of lattice parameters of Al–10.65Si–2.11Cu (aluminium-based solid solution) and Al–5.39Si–1.33Cu (Al1 and Al2 phases). The reason for the crystal-lattice parameter change in the Al–10.65Si–2.11Cu and Al–5.39Si–1.33Cu alloys is suggested to be the changing concentration of alloying elements in the solid solution of these phases. As established, if a density of electron beam is of 30 and 50 J/cm2, the silicon and intermetallic compounds dissolve in the modified layer. The state-of-the-art methods of the physical materials science made possible to establish the formation of a layer with a nanocrystalline structure of the cell-type crystallization because of the material surface irradiation. The thickness of a modified layer depends on the parameters of the electron-beam treatment and reaches maximum of 90 µm at the energy density of 50 J/cm2. According to the transmission (TEM) and scanning (SEM) electron microscopy data, the silicon particles occupy the cell boundaries. Such changes in the structural and phase states of the materials response on their mechanical characteristics. To characterize the surface properties, the microhardness, wear parameter, and friction coefficient values are determined directly on the irradiated surface for all modification variants. As shown, the irradiation of the material surface with an intensive electron beam increases wear resistance and microhardness of the Al–10.65Si–2.11Cu and Al–5.39Si–1.33Cu alloys.


Nano Letters ◽  
2005 ◽  
Vol 5 (7) ◽  
pp. 1303-1307 ◽  
Author(s):  
Willem F. van Dorp ◽  
Bob van Someren ◽  
Cornelis W. Hagen ◽  
Pieter Kruit ◽  
Peter A. Crozier

2009 ◽  
Vol 4 (1) ◽  
pp. 30-36
Author(s):  
Petr Bak ◽  
Dmitriy Bolkhovityanov ◽  
Andrey Korepanov ◽  
Pavel Logatchev ◽  
Dmitriy Malyutin ◽  
...  

Instrument for bunch tilt measurements in linear collider is presented. Electron beam probe basic principles are described and method of bunch tilt measurements is discussed. The simulation results of testing beam interaction with tilted relativistic bunch are presented. Main components of the bunch tilt measurement error are determined.


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