scholarly journals Complementary Visualization of Mitotic Barley Chromatin by Field-Emission Scanning Electron Microscopy and Scanning Force Microscopy

2000 ◽  
Vol 129 (1) ◽  
pp. 17-29 ◽  
Author(s):  
A. Schaper ◽  
M. Rößle ◽  
H. Formanek ◽  
T.M. Jovin ◽  
G. Wanner
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Field Emission ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Scanning Electron

Photoelectric Response of Self Assembled Films of Bacterio-Rhodopsin Purple Membrane Integrated on Silicon

2003 ◽  
Vol 774 ◽  
Author(s):  
D. Ricceri ◽  
G. Scicolone ◽  
O. Di Marco ◽  
S. Conoci ◽  
B. Pignataro ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Light Exposure ◽  
Scanning Force Microscopy ◽  
Purple Membrane ◽  
Morphological Properties ◽  
Force Microscopy ◽  
Scanning Force ◽  
Scanning Electron ◽  
Tungsten Lamp

AbstractBacterio-rhodopsin purple membrane (PM) thin films have been prepared by selfassembling (SA) technique. Morphological properties of the layers were inspected by Scanning Electron Microscopy (SEM) and Scanning Force Microscopy (SFM) highlighting the presence of densely packed PM films. Reflectance Uv-vis spectra on these films revealed the typical bR absorption at 570 nm. By using a tungsten lamp illuminations (250-350 mW) chopped at 0.5Hz, photoelectric responses were detected. Differential (light-on and light-off) photocurrent signals of up to 1 μA/cm2 were obtained upon light exposure.

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

Electrical and Structural Properties of ZnO/TiO2 Nanocomposite Thin Films by RF Magnetron Co-Sputtering

2013 ◽  
Vol 667 ◽  
pp. 206-212 ◽  
Author(s):  
I. Saurdi ◽  
Mohamad Hafiz Mamat ◽  
Mohamad Rusop
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Field Emission ◽  
Deposition Time ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocomposite Thin Films ◽  
Scanning Electron

In this study, the ZnO/TiO2 nanocomposite thin films were prepared by RF Magnetron co-sputtering ZnO and TiO2 targets at different deposition times from 30-75 minutes. The electrical and structural properties ZnO/TiO2 nanocomposite thin films were characterized by I-V measurement, atomic force microscopy (AFM) and field emission scanning electron microscopy (FE-SEM). The electrical characteristics of nanocomposite films revealed that the conductivity of thin films increases as the thickness increase due to the improvement in surface contact between particles as well as photocatalytic activity. High conductivity at 1.67x10-4 S/cm and lowest resistivity about 5.14x104 Ω/cm were obtained for 75 minutes deposition time. Atomic force microscopy (AFM) showed particle size of ZnO/TiO2 thin films varied from 27nm to 51nm with an increasing in deposition time with granular shapes structures were observed from field emission scanning electron microscopy (FE-SEM).

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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