Preparation of PZT Thin Films on Stainless Steel Using Electrochemical Reduction

1998 ◽  
Vol 136 (2) ◽  
pp. 293-297 ◽  
Author(s):  
Michio Koinuma ◽  
Hideki Ohmura ◽  
Yoshiro Fujioka ◽  
Yasumichi Matsumoto ◽  
Satoshi Yamada
Keyword(s):  
Thin Films ◽  
Stainless Steel ◽  
Electrochemical Reduction ◽  
Pzt Thin Films

scholarly journals Comparison between PZT thin films deposited on stainless steel and on platinum/silicon substrate

2008 ◽  
Vol 94 ◽  
pp. 012012 ◽  
Author(s):  
V Stancu ◽  
F Sava ◽  
M Lisca ◽  
L Pintilie ◽  
M Popescu
Keyword(s):  
Thin Films ◽  
Stainless Steel ◽  
Silicon Substrate ◽  
Pzt Thin Films

Characterization of Textured PZT Thin Films Prepared by Sol-gel Method onto Stainless Steel Substrates

2011 ◽  
Vol 1299 ◽  
Author(s):  
Xuelian Zhao ◽  
Xufang Yu ◽  
Shengwen Yu ◽  
Jinrong Cheng
Keyword(s):  
Thin Films ◽  
Stainless Steel ◽  
Ferroelectric Properties ◽  
Sol Gel ◽  
Buffer Layers ◽  
Sem Images ◽  
Pzt Thin Films ◽  
Gel Method ◽  
Sol Gel Method ◽  
Ss Substrates

ABSTRACTPbZr0.53Ti0.47O3 (PZT) ferroelectric thin films were deposited on LaNiO3 (LNO) buffered stainless steel (SS) substrates by sol-gel method. The effect of LNO buffer layer on the orientation and electric properties of PZT thin films for different thicknesses were studied. X-ray diffraction (XRD) results indicated that PZT thin films on SS substrates exhibit the (100) preferred orientation with the LNO buffer layers. Scanning electron microscope (SEM) images show that PZT thin films were well crystallized with grain size of about 100 nm. PZT thin films deposited on SS maintain the excellent ferroelectric properties with remnant polarization of about 20 μC/cm2.

Structural, ferroelectric and optical properties of PZT thin films

2005 ◽  
Vol 369 (1-4) ◽  
pp. 135-142 ◽  
Author(s):  
S.K. Pandey ◽  
A.R. James ◽  
R. Raman ◽  
S.N. Chatterjee ◽  
Anshu Goyal ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Pzt Thin Films
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