The hysteresis of the critical current in superconducting tin whiskers

1988 ◽  
Vol 70 (1-2) ◽  
pp. 131-150 ◽  
Author(s):  
B. Damaschke ◽  
X. Yang ◽  
R. Tidecks
Keyword(s):  
Critical Current ◽  
Tin Whiskers

Superconducting and fermi surface parameters of strained tin whiskers

Physica B+C ◽  
1981 ◽  
Vol 107 (1-3) ◽  
pp. 717-718
Author(s):  
B. Rothberg-Bibby ◽  
D.S. McLachlan ◽  
H.J. Fink ◽  
F.R.N. Nabarro
Keyword(s):  
Fermi Surface ◽  
Tin Whiskers ◽  
Surface Parameters

Application of Electron Backscatter Diffraction for Crystallographic Characterization of Tin Whiskers

2012 ◽  
Vol 18 (4) ◽  
pp. 876-884 ◽  
Author(s):  
Joseph R. Michael ◽  
Bonnie B. McKenzie ◽  
Donald F. Susan
Keyword(s):  
Electron Backscatter Diffraction ◽  
Growth Direction ◽  
Tin Whiskers ◽  
Physical Growth ◽  
Final Choice ◽  
Advantages And Disadvantages ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractUnderstanding the growth of whiskers or high aspect ratio features on substrates can be aided when the crystallography of the feature is known. This study has evaluated three methods that utilize electron backscatter diffraction (EBSD) for the determination of the crystallographic growth direction of an individual whisker. EBSD has traditionally been a technique applied to planar, polished samples, and thus the use of EBSD for out-of-surface features is somewhat more difficult and requires additional steps. One of the methods requires the whiskers to be removed from the substrate resulting in the loss of valuable physical growth relationships between the whisker and the substrate. The other two techniques do not suffer this disadvantage and provide the physical growth information as well as the crystallographic growth directions. The final choice of method depends on the information required. The accuracy and the advantages and disadvantages of each method are discussed.

The Effect of Stress on the Magnetic Superconducting Transitions of Tin Whiskers

1974 ◽  
pp. 503-506
Author(s):  
B. D. Rothberg ◽  
F. R. N. Nabarro ◽  
D. S. McLachlan
Keyword(s):  
Tin Whiskers ◽  
Superconducting Transitions

Electron Microscopy of Tin Whiskers using Carbon Replicas

1957 ◽  
Vol 70 (9) ◽  
pp. 889-892 ◽  
Author(s):  
D E Bradley ◽  
J Franks ◽  
P E Rush
Keyword(s):  
Electron Microscopy ◽  
Tin Whiskers ◽  
Carbon Replicas

Tin Whiskers in Electronics

2006 ◽  
pp. 551-625 ◽  
Author(s):  
Yuki Fukuda ◽  
Tong Fang ◽  
Sanka Ganesan ◽  
Michael Osterman ◽  
Michael Pecht
Keyword(s):  
Tin Whiskers

Selective growth of tin whiskers from its alloys on Ti2SnC

2020 ◽  
Vol 54 ◽  
pp. 206-210
Author(s):  
Jingwen Tang ◽  
Peigen Zhang ◽  
Yushuang Liu ◽  
Chengjie Lu ◽  
Yan Zhang ◽  
...  
Keyword(s):  
Selective Growth ◽  
Tin Whiskers

Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction

2003 ◽  
Vol 51 (20) ◽  
pp. 6253-6261 ◽  
Author(s):  
W.J. Choi ◽  
T.Y. Lee ◽  
K.N. Tu ◽  
N. Tamura ◽  
R.S. Celestre ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Tin Whiskers ◽  
X Ray
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