Computational Schemes for Quantitative X-Ray Analysis: On-Line Analysis with Small Computers

1975 ◽  
pp. 373-400
Author(s):  
H. Yakowitz
Keyword(s):  
X Ray ◽  
Computational Schemes ◽  
On Line ◽  
Line Analysis

On-Belt Determination of Calcium Concentration by X-ray Fluorescence

1990 ◽  
Vol 34 ◽  
pp. 231-237
Author(s):  
M. Hirvonen
Keyword(s):  
Calcium Concentration ◽  
Industrial Processes ◽  
Process Conditions ◽  
Analysis Method ◽  
Sampling System ◽  
X Ray ◽  
Elemental Concentrations ◽  
On Line ◽  
Line Analysis

AbstractX-ray fluorescence has a long tradition as an on-line analysis method in many kinds of industrial processes. It is capable of determining elemental concentrations in material flows even under severe and varying process conditions with an accuracy which is often sufficient for on-line control purposes. Many times the elemental concentrations correlate highly enough with those of the minerals of interest to give useful mineral analysis. In general, a rather well-defined geometry in the XRF measurement is necessary for accurate results, which may impose strict requirements on the sampling system.

On-Site Tests of a XRD/XRF On-Line Process Analyzers

1988 ◽  
Vol 32 ◽  
pp. 59-68
Author(s):  
A. Ahonen ◽  
C.V. Alfthan ◽  
M. Hirvonen ◽  
J. Ollikainen ◽  
M. Rintamaki ◽  
...  
Keyword(s):  
Titanium Dioxide ◽  
Industrial Processes ◽  
Analysis Method ◽  
X Ray ◽  
On Line ◽  
Line Process ◽  
Paper Filler ◽  
Line Analysis

X-ray fluorescence (XRF) has been successfully used for more than 20 years as an on-line analysis method for controlling various industrial processes where the concentrations of different elements must be known in the process streams. In many industrial processes, however, the knowledge of the concentrations of different minerals, rather than those of the elements, is of prime importance. Examples of such processes are numerous; plants concentrating apatite for fertilizer and detergent manufacturers, paper filler producers manufacturing kaoline, titanium dioxide (rutile) and talc, potash concentrators and different crystallization processes.

Study of on-line analysis using energy dispersive X-ray fluorescence spectrometry for controlling lanthanum and neodymium extraction

1998 ◽  
Vol 362 (2-3) ◽  
pp. 253-260 ◽  
Author(s):  
Li Wenli ◽  
G.D' Ascenzo ◽  
R. Curini ◽  
G.M. Gasparini ◽  
M. Casarci ◽  
...  
Keyword(s):  
Energy Dispersive ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
On Line ◽  
Line Analysis

On-Line Analysis Of Molten Metals Using a Wavelength Dispersive X-Ray Spectrometer

1993 ◽  
Vol 37 ◽  
pp. 729-733
Author(s):  
Larry E. Creasy
Keyword(s):  
Electron Beam ◽  
Molten Metal ◽  
Wave Length ◽  
Melting Process ◽  
X Rays ◽  
Molten Metals ◽  
X Ray ◽  
On Line ◽  
Time Required ◽  
Line Analysis

AbstractThe electron beam furnace is a nearly ideal tool to conduct on-line analysis of molten metal. In the process of melting the metal with a high intensity electron beam, x-rays are created. A wave-length dispersive x-ray spectrometer, specially designed for this environment, has been used to analyze the composition of the molten metal. This significantly reduces the time required to determine the concentration of critical elements in the melting process.

Feasibility of using x-ray diffraction for on-line analysis of gypsum during wall board manufacturing

1995 ◽  
Vol 8 (9) ◽  
pp. 1069-1074
Author(s):  
G.A. Norton ◽  
R.E. Peters ◽  
R.A. Jacobson
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
On Line ◽  
Line Analysis

On-line analysis of chrome-iron ores on a conveyor belt using x-ray fluorescence analysis

2005 ◽  
Vol 34 (5) ◽  
pp. 456-459 ◽  
Author(s):  
A. D. Sokolov ◽  
D. Docenko ◽  
E. Bliakher ◽  
O. Shirokobrod ◽  
Juha Koskinen
Keyword(s):  
Fluorescence Analysis ◽  
Conveyor Belt ◽  
Iron Ores ◽  
X Ray ◽  
On Line ◽  
Line Analysis

scholarly journals X-ray powder diffraction for charge density studies

2014 ◽  
Vol 70 (a1) ◽  
pp. C1339-C1339
Author(s):  
Jens Als-Nielsen
Keyword(s):  
Charge Density ◽  
Powder Diffraction ◽  
X Ray ◽  
Image Plate ◽  
Structure Factors ◽  
Crystal Analyzer ◽  
On Line ◽  
Line Analysis ◽  
Capillary Temperature ◽  
Detector Type

Issues concerning optimal powder diffraction at synchrotron sources for charge density studies will be discussed. These include beam qualities (energy, bandwidth, brillance, flux) as well as sample environmnet (vaccuum, capillary, temperature) and detector type (image plate, crystal analyzer). Simple on-line analysis in obtaining structure factors will be presented.

Mickey, A Computer Helping Hand for the Everyday use of the T.E.M.

1990 ◽  
Vol 48 (1) ◽  
pp. 602-603
Author(s):  
Chemelle Pierre ◽  
Muller Bernard ◽  
Crouillère Michel
Keyword(s):  
Photographic Plate ◽  
X Ray ◽  
Performance Improvements ◽  
Transmission Electron ◽  
The Everyday ◽  
On Line ◽  
Ethernet Network ◽  
Time Required ◽  
Line Analysis ◽  
Serial Line

The efficiency of transmission electron microscopy investigations is drastically impaired by the time required for photographic plate development, measurements and interpretation. Very often, the operator has to go back to the microscope to complete his analysis. The evolution of the TEM, through the automation of an increasing number of operating parameters and the increasing use of small computers has led to a variety of performance improvements.The outline of the microscope facility that we developed is shown in Figure 1. The TEM/STEM EM400T PHILIPS microscope is linked simultaneously to the EDAX PDP devoted to X-ray microanalysis and to a DEC μPDP for diffraction analysis. This second computer, operating in a multitask RSX environment can be used for on-line and off-line analysis of patterns, microanalysis data and crystallographic calculations. The μPDP is coupled to the microscope via ADC/DAC converters and the Hybrid Diffraction STEM apparatus. The two computers are connected through a serial line for data transmission (i.e. spectra and chemical analysis). As a whole, this facility is integrated in a DEC ETHERNET network connected to a mainframe VAX computer. Several image workstations, are among the other nodes of the network.

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