Quantitative Analysis of 300 and 400 Series Stainless Steel by Energy Dispersive X-Ray Fluorescence

1979 ◽  
pp. 395-400
Author(s):  
Bradner D. Wheeler ◽  
Nancy Jacobus
Keyword(s):  
Stainless Steel ◽  
Quantitative Analysis ◽  
Energy Dispersive ◽  
X Ray

Comparison of high-angle take-off and low-angle take-off EDX detector geometry of the HF-2000 FE-TEM

1993 ◽  
Vol 51 ◽  
pp. 252-253
Author(s):  
Y. Sato ◽  
T. Hashimoto ◽  
M. Ichihashi ◽  
Y. Ueki ◽  
K. Hirose ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Field Emission ◽  
Solid Angle ◽  
Energy Dispersive ◽  
Objective Lens ◽  
X Rays ◽  
High Angle ◽  
X Ray ◽  
Detector Geometry

Analytical TEMs have two variations in x-ray detector geometry, high and low angle take off. The high take off angle is advantageous for accuracy of quantitative analysis, because the x rays are less absorbed when they go through the sample. The low take off angle geometry enables better sensitivity because of larger detector solid angle.Hitachi HF-2000 cold field emission TEM has two versions; high angle take off and low angle take off. The former allows an energy dispersive x-ray detector above the objective lens. The latter allows the detector beside the objective lens. The x-ray take off angle is 68° for the high take off angle with the specimen held at right angles to the beam, and 22° for the low angle take off. The solid angle is 0.037 sr for the high angle take off, and 0.12 sr for the low angle take off, using a 30 mm2 detector.

VHCF damage in duplex stainless steel revealed by microbeam energy-dispersive X-ray Laue diffraction

2021 ◽  
pp. 106358
Author(s):  
Ali Abboud ◽  
Ali AlHassan ◽  
Benjamin Dönges ◽  
Jean Sebastian Micha ◽  
Robert Hartmann ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Energy Dispersive ◽  
Laue Diffraction ◽  
X Ray

X-Ray Quantitative Analysis of Transformed Martensite in Austentic Stainless Steel

1997 ◽  
pp. 481-489
Author(s):  
Zenjiro Yajima ◽  
Yoichi Kishi ◽  
Yukio Hirose
Keyword(s):  
Stainless Steel ◽  
Quantitative Analysis ◽  
X Ray

scholarly journals Evaluation of Internal Stress in Individual Grains of Cold-Rolled Stainless Steel by Energy Dispersive X-ray Diffraction

2013 ◽  
Vol 53 (1) ◽  
pp. 165-169 ◽  
Author(s):  
Kentaro Kajiwara ◽  
Masugu Sato ◽  
Tamotsu Hashimoto ◽  
Takuyo Yamada ◽  
Takumi Terachi ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Internal Stress ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cold Rolled ◽  
Individual Grains

Results of quantitative analysis of Celtic glass artefacts by energy dispersive X-ray fluorescence spectrometry

2003 ◽  
Vol 58 (4) ◽  
pp. 627-633 ◽  
Author(s):  
C. Jokubonis ◽  
P. Wobrauschek ◽  
S. Zamini ◽  
M. Karwowski ◽  
G. Trnka ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Energy Dispersive ◽  
Fluorescence Spectrometry ◽  
X Ray

“Standardless” Quantitative Analysis by Electron-Excited Energy Dispersive X-Ray Spectrometry: What is its Proper Role?

1998 ◽  
Vol 4 (S2) ◽  
pp. 194-195
Author(s):  
Dale E. Newbury
Keyword(s):  
Quantitative Analysis ◽  
Energy Dispersive ◽  
K Value ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Proper Role ◽  
Wide Range ◽  
Measured Characteristic ◽  
Electron Range

The development of energy dispersive x-ray spectrometry (EDS) has had a profound impact on the methodology of quantitative x-ray microanalysis of thick specimens (i.e., thickness≫ electron range) as performed in electron beam instruments. By equipping the scanning electron microscope (SEM) with EDS, quantitative x-ray microanalysis has become commonly available to a wide range of users, at least some of whom have only a modest background in analytical science. An important aspect of the development of quantitative analysis by EDS has been the extensive analytical experience gained during the development of the electron probe microanalyzer (EPMA) equipped with wavelength dispersive x-ray spectrometers (WDS). The critical measurement step for quantitative WDS analysis was recognized to be the determination of the “k-value”:k = Iunk / Istd (1)where I is the measured characteristic intensity of a specific x-ray peak, corrected for background and peak overlaps, for both the unknown and the standard.

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