Determination of X-ray Elastic Constants of Isotropic Materials with Non-Linear SIN2 ψ Diagrams

1994 ◽  
pp. 299-304
Author(s):  
Toshihiko Sasaki ◽  
Yukio Hirose
1993 ◽  
Vol 37 ◽  
pp. 299-304
Author(s):  
Toshihiko Sasaki ◽  
Yukio Hirose

As known well, non-linear sin2ϕ diagrams are observed from materials having either steep gradients of residual stresses paralell to the surface normal of the specimen or tri-axial stress components. Many authors have reported on this problem for several processing such as polishing and grinding etc. The authors also obtained such non-linear data from an electro-plated zinc—nickel alloy. For these cases, the sin2ϕ method is inadequate for the stress evaluation. Much attention has been given to the stress analysis from about 1970s as compared to the X-ray elastic constants for this phenomenon.


1990 ◽  
Vol 34 ◽  
pp. 689-698 ◽  
Author(s):  
J. Jo ◽  
R. W. Hendricks ◽  
W. D. Brewer ◽  
Karen M. Brown

Residual stress values in a material are governed by the measurements of the atomic spacings in a specific crystallographic plane and the elastic constant for that plane. It has been reported that the value of the elastic constant depends on microstructure, preferred orientation, plastic deformation and morphology [1], Thus, the theoretical calculation of the elastic constant may deviate from the intrinsic value for a real alloy.


1982 ◽  
Vol 26 ◽  
pp. 259-267
Author(s):  
Charles Goldsmith ◽  
George A. Walker

AbstractThe powder diffraction x-ray technique commonly used to measure strain in polycrystalline materials requires a knowledge of the elastic constants in order to convert the strain into a stress value. For many materials, these constants are not always known. Another technique to measure strain is the x-ray lattice curvature (substrate bending) method which requires no knowledge of the film elastic constants. The strain is measured in the substrate and requires only the elastic constants of the substrate to convert the measured strain into stress. Using a combination of the powder diffraction technique and a double crystal lattice curvature technique, the elastic constants of TaSi2 and WSi2 have been determined for various crystallographic directions.


1955 ◽  
Vol 8 (8) ◽  
pp. 506-507 ◽  
Author(s):  
S. C. Prasad ◽  
W. A. Wooster
Keyword(s):  

1985 ◽  
Vol 18 (6) ◽  
pp. 513-518 ◽  
Author(s):  
M. Hayakawa ◽  
S. Imai ◽  
M. Oka

A method for determining cubic stiffness constants from polcrystalline Young's modulus and X-ray elastic constants is described. The relations used among these elastic constants are those based on Kröner's quasiisotropic model. The X-ray elastic constants required [S1(hkl)] are obtained by measuring various (hkl) d spacings of a stressed specimen under symmetric θ–2θ scan mode. An application to an Fe–31Ni alloy has given the results: C 11 = 1.47, C 12 = 1.05 and C 44 = 1.24 × 1011 Pa.


2008 ◽  
Vol 15 (6) ◽  
pp. 618-623 ◽  
Author(s):  
Hiroshi Fukui ◽  
Tomoo Katsura ◽  
Takahiro Kuribayashi ◽  
Takuya Matsuzaki ◽  
Akira Yoneda ◽  
...  

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