The Use of the Conventional Isolated Atom Model for the Theoretical Calculation of the Dependence of Lβ/Lα Intensity Ratio on the Sample Exit Angle for Unoxidized and Oxidized Transition Metal Alloy Thin Films

1992 ◽  
pp. 845-850
Author(s):  
Francis Fujiwara ◽  
George Andermann
1991 ◽  
Vol 35 (B) ◽  
pp. 845-850
Author(s):  
Francis Fujiwara ◽  
George Andermann

Variable sample exit angle x-ray fluorescence spectroscopy (VEA-XRF) employing the Lβ/Lα intensity ratio for transition metals and their oxides has been shown to be useful for non-destructively studying transition metal surfaces and oxidation, as well as, superconductors. Thus the theoretical formulation of the Lβ/Lα intensity ratio dependence on the sample exit angle, θe, is of some interest and we develop it here. We also present methods of obtaining parameters needed in the formulation, such as Lβ absorption coefficients, which are not available in the literature, for wavelengths greater than about 12Å.


1993 ◽  
Vol 28 (1) ◽  
pp. 67-71 ◽  
Author(s):  
J.F. Qui ◽  
K.N.R. Taylor ◽  
G.J. Russell

1991 ◽  
Vol 19 (1-4) ◽  
pp. 263-265 ◽  
Author(s):  
A. Vega ◽  
J. Dorantes-D�vila ◽  
G. M. Pastor ◽  
L. C. Balb�s

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