The Use of the Conventional Isolated Atom Model for the Theoretical Calculation of the Dependence of Lβ/Lα: Intensity Ratio on the Sample Exit Angle for Unoxidized and Oxidized Transition Metal Alloy Thin Films

Variable sample exit angle x-ray fluorescence spectroscopy (VEA-XRF) employing the Lβ/Lα intensity ratio for transition metals and their oxides has been shown to be useful for non-destructively studying transition metal surfaces and oxidation, as well as, superconductors. Thus the theoretical formulation of the Lβ/Lα intensity ratio dependence on the sample exit angle, θe, is of some interest and we develop it here. We also present methods of obtaining parameters needed in the formulation, such as Lβ absorption coefficients, which are not available in the literature, for wavelengths greater than about 12Å.

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The Use of the Conventional Isolated Atom Model for the Theoretical Calculation of the Dependence of Lβ/Lα Intensity Ratio on the Sample Exit Angle for Unoxidized and Oxidized Transition Metal Alloy Thin Films

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3460-0_20 ◽

1992 ◽

pp. 845-850

Author(s):

Francis Fujiwara ◽

George Andermann

Keyword(s):

Thin Films ◽

Transition Metal ◽

Theoretical Calculation ◽

Intensity Ratio ◽

Metal Alloy ◽

Exit Angle ◽

Transition Metal Alloy ◽

Atom Model

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Characterization of Permalloy Thin Films via Variable Sample Exit Angle Ultrasoft X-ray Fluorescence Spectrometry

Advances in X-ray Analysis ◽

10.1154/s0376030800020565 ◽

1988 ◽

Vol 32 ◽

pp. 261-268 ◽

Cited By ~ 1

Author(s):

George Andermann ◽

Francis Fujiwara ◽

T.C. Huang ◽

J.K. Howard ◽

N. Staud

Keyword(s):

Thin Films ◽

Transition Metal ◽

Analytical Tool ◽

Fluorescence Spectrometry ◽

Exit Angle ◽

X Ray ◽

Escape Depth ◽

Sample Depth ◽

Permalloy Thin Films

Recently variable sample exit-angle x-ray fluorescence spectrometry (VEA-XRF) has been shorn to be a useful analytical tool for monitoring the oxidation of the surfaces of bulk Cu, Ni as well as that of Fe. In these studies advantage was taken of the well known phenomenon that for each transition metal oxide (MO) Lβ/Lα intensity ratio value is higher than for the transition metal (M), itself. Within the limits of the photon-escape depth de, which for these photons are generally below 5000 Å, varying the sample exit-angle θ offers an opportunity for seeing whether or not the oxidation of the surfaces of bulk M belongs to one of the following two classes: (I) uniform oxidation throughout the entire observable sample-depth, (II) preferential oxidation of the top surface layer, i.e. depth dependent oxidation.

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Soft X-Ray Valance State Effects in Conductors

Advances in X-ray Analysis ◽

10.1154/s0376030800011344 ◽

1969 ◽

Vol 13 ◽

pp. 136-157 ◽

Cited By ~ 4

Author(s):

J. E. Holliday

Keyword(s):

Thin Films ◽

Transition Metal ◽

Intensity Ratio ◽

Low Energy ◽

Ionic Character ◽

Electrode Geometry ◽

Band Shape ◽

X Ray ◽

Electronegativity Difference ◽

Band Spectra

Investigation of the NiLIII band at various excitation voltages and the use of Ni and Ti thin films in the path of the NiLII,III and TiLII,III radiation, has shown that with proper electrode geometry and using target voltages of about 4 kv the effect of self absorption on emission edge shift and band shape is negligible for these elements. However, the LII/LIII intensity ratio of titanium is strongly effected by self absorption, but it is not effected for nickel and iron by self absorption.A survey of several investigators’ soft x-ray band spectra from alloys and conducting compounds showed that the observed band changes were related to the electronegativity difference of the combining elements or the ionic character of the band. Peaks appearing on the low energy side of transition metal bands when combined with 2nd period elements appear to be a cross transition between the 2s or 2p band of the non-metal and inner level of the metal.

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