Characterization of a β-Glucan Particle Using the Scanning Tunneling and Atomic Force Microscopes

Measurement of Plasticity Gradients with Scanning Probe Microscopy

MRS Proceedings ◽

10.1557/proc-318-401 ◽

1993 ◽

Vol 318 ◽

Author(s):

James D. Kiely ◽

Dawn A. Bonnell

Keyword(s):

Fracture Surface ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Scanning Tunneling ◽

Ceramic System ◽

Force Microscopy ◽

Metal Fracture ◽

Atomic Force ◽

Metal Ceramic

ABSTRACTScanning Tunneling and Atomic Force Microscopy were used to characterize the topography of fractured Au /sapphire interfaces. Variance analysis which quantifies surface morphology was developed and applied to the characterization of the metal fracture surface of the metal/ceramic system. Fracture surface features related to plasticity were quantified and correlated to the fracture energy and energy release rate.

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Scanning tunneling microscopy and atomic force microscopy characterization of polystyrene spin-coated onto silicon surfaces

Langmuir ◽

10.1021/la00039a030 ◽

1992 ◽

Vol 8 (3) ◽

pp. 920-926 ◽

Cited By ~ 63

Author(s):

T. G. Stange ◽

Roy Mathew ◽

D. Fennell Evans ◽

W. A. Hendrickson

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Silicon Surfaces ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study

Microscopy and Microanalysis ◽

10.1017/s1431927600023126 ◽

1998 ◽

Vol 4 (S2) ◽

pp. 600-601

Author(s):

John Rakovan ◽

F. Hochella Michael

Keyword(s):

Lateral Force ◽

Atomic Scale ◽

Scanning Tunneling ◽

Mineral Surfaces ◽

Tunneling Microscopy ◽

Heterogeneous Oxidation ◽

Force Microscopy ◽

Solution Interface ◽

Atomic Force

Since its invention inl982 scanning probe microscopy (SPM) has become an important analytical tool in every branch of physical science. The two most widely used types of SPM are atomic force Microscopy (AFM) and scanning tunneling microscopy (STM). Both AFM and STM allow measurement of the microtopography of a surface down to the atomic scale. Many spin-off applications such as lateral force and magnetic force allow measurement of a variety of the physical properties of a surface while imaging its microtopography. SPM can be done in both air and liquid and hence can be used to observe the interactions that take place at a solid-solution interface.SPM has been used in mineralogy and geochemistry since 1989. Here as in other applications the great strength of SPM is in the characterization of the heterogeneous nature of mineral surfaces and the ability to observe many geochemical processes in real time.

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