Three-Dimensional Reconstruction of Nucleolar Components by Electron Microscope Tomography

2008 ◽  
pp. 137-158 ◽  
Author(s):  
Pavel Tchelidze ◽  
Hervé Kaplan ◽  
Adrien Beorchia ◽  
Marie-Françoise O’Donohue ◽  
Hélène Bobichon ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Three Dimensional ◽  
Three Dimensional Reconstruction ◽  
Dimensional Reconstruction ◽  
Nucleolar Components

Overabundant single-particle electron microscope views induce a three-dimensional reconstruction artifact

1998 ◽  
Vol 74 (4) ◽  
pp. 201-207 ◽  
Author(s):  
Nicolas Boisset ◽  
Pawel A. Penczek ◽  
Jean-Christophe Taveau ◽  
Valérie You ◽  
Felix de Haas ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Single Particle ◽  
Three Dimensional ◽  
Three Dimensional Reconstruction ◽  
Dimensional Reconstruction

A side-entry high-precision tilt stage for a high-voltage Electron Microscope

1986 ◽  
Vol 44 ◽  
pp. 628-629
Author(s):  
J.N. Turner ◽  
D.P. Barnard ◽  
G. Matuszek ◽  
C.W. See
Keyword(s):  
Electron Microscope ◽  
High Precision ◽  
High Voltage ◽  
Three Dimensional ◽  
Three Dimensional Reconstruction ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Dimensional Reconstruction ◽  
Electron Microscopes

A high precision specimen stage is essential for the accurate recording of images for three-dimensional reconstruction. The efficient calculation and resolution of a “tomographic type” three-dimensional reconstruction is influenced by the precision of the angular tilt settings. The ability to identify structures at low magnification and later return to them for detailed study at high magnification is crucial to the efficient study of structures by serial section reconstruction, and is greatly aided by a precise, repeatable translation stage. To study such problems, we have designed and fabricated a single-tilt specimen stage for our high-voltage electron microscope (HVEM), which represents a different design philosophy to that usually employed in side entry stages for transmission electron microscopes.

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