Repairable Fountain Codes with Unequal Repairing Locality in D2D Storage System

Author(s):  
Yue Li ◽  
Shushi Gu ◽  
Ye Wang ◽  
Juan Li ◽  
Qinyu Zhang
2021 ◽  
Author(s):  
Anan Zhou ◽  
Benshun Yi ◽  
Mian Xiang ◽  
Laigan Luo

Abstract Distributed storage system (DSS) is an emerging paradigm which provides reliable storage services for various source data. As the fault-tolerance scheme for DSS, erasure codes are required to provide redundancy service with high fault-tolerance and low cost. However, the existing coding scheme cannot provide these requirements well. Thus, it becomes an important yet challenging issue to find a code for storing various source data with high fault-tolerance and low cost. In this paper, a novel construction of repairable fountain codes with unequal locality is proposed by combining with partial duplication tech- nique, namely the PD-ULRFC scheme. We construct a multi-tier heterogeneous storage network, where data core, processing units and storage nodes collaboratively store and transmit data. Moreover, the proposed PD-ULRFC scheme can reduce the repair and download cost by sacrificing a little extra storage occupation. Furthermore, the expressions of the repair cost and download cost are derived to analyze the performance of PD-ULRFC scheme. The simulation results demonstrate that the PD-ULRFC scheme significantly outperforms other redundant schemes in communication cost saving.


Author(s):  
Y. Kokubo ◽  
W. H. Hardy ◽  
J. Dance ◽  
K. Jones

A color coded digital image processing is accomplished by using JEM100CX TEM SCAN and ORTEC’s LSI-11 computer based multi-channel analyzer (EEDS-II-System III) for image analysis and display. Color coding of the recorded image enables enhanced visualization of the image using mathematical techniques such as compression, gray scale expansion, gamma-processing, filtering, etc., without subjecting the sample to further electron beam irradiation once images have been stored in the memory.The powerful combination between a scanning electron microscope and computer is starting to be widely used 1) - 4) for the purpose of image processing and particle analysis. Especially, in scanning electron microscopy it is possible to get all information resulting from the interactions between the electron beam and specimen materials, by using different detectors for signals such as secondary electron, backscattered electrons, elastic scattered electrons, inelastic scattered electrons, un-scattered electrons, X-rays, etc., each of which contains specific information arising from their physical origin, study of a wide range of effects becomes possible.


2016 ◽  
Vol 136 (11) ◽  
pp. 824-832 ◽  
Author(s):  
Mami Mizutani ◽  
Takenori Kobayashi ◽  
Katsunori Watabe ◽  
Tomoki Wada

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