Defect Characterization

2020 ◽  
pp. 181-210
Author(s):  
Vladimir Vavilov ◽  
Douglas Burleigh
Keyword(s):  
Defect Characterization

Deep learning for defect characterization in composite laminates inspected by step-heating thermography

2021 ◽  
Vol 145 ◽  
pp. 106679
Author(s):  
Roberto Marani ◽  
Davide Palumbo ◽  
Umberto Galietti ◽  
Tiziana D'Orazio
Keyword(s):  
Deep Learning ◽  
Composite Laminates ◽  
Defect Characterization ◽  
Step Heating

Charge Pumping and Flicker Noise-based Defect Characterization in Ferroelectric FETs

2020 ◽  
Author(s):  
Yannick Raffel ◽  
Maximilian Lederer ◽  
Ricardo Olivo ◽  
Franz Muller ◽  
Raik Hoffmann ◽  
...  
Keyword(s):  
Flicker Noise ◽  
Defect Characterization ◽  
Charge Pumping

scholarly journals Quantum Sensor for Nanoscale Defect Characterization

2021 ◽  
Vol 15 (2) ◽  
Author(s):  
J. Kerski ◽  
P. Lochner ◽  
A. Ludwig ◽  
A.D. Wieck ◽  
A. Kurzmann ◽  
...  
Keyword(s):  
Defect Characterization

Microstructure and defect characterization at interfaces in TiN/CrN multilayer coatings

2008 ◽  
Vol 202 (24) ◽  
pp. 6075-6080 ◽  
Author(s):  
L. Major ◽  
W. Tirry ◽  
G. Van Tendeloo
Keyword(s):  
Multilayer Coatings ◽  
Defect Characterization

scholarly journals Defect characterization in pipe-to-pipe welds in large-diameter stainless-steel piping

1994 ◽  
Vol 33 (2) ◽  
pp. 155-162 ◽  
Author(s):  
D.E. Rawl ◽  
S.L. West ◽  
D.A. Wheeler ◽  
M.R. Louthan
Keyword(s):  
Stainless Steel ◽  
Large Diameter ◽  
Defect Characterization ◽  
Steel Piping

Defect characterization of CdTe thin films using a slow positron beam

2007 ◽  
Vol 4 (10) ◽  
pp. 3659-3663 ◽  
Author(s):  
S. Neretina ◽  
D. Grebennikov ◽  
R. A. Hughes ◽  
M. Weber ◽  
K. G. Lynn ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Beam ◽  
Defect Characterization ◽  
Slow Positron ◽  
Cdte Thin Films

Subwavelength Defect Characterization Using Guided Wave Scattering Matrix

2013 ◽  
Vol 330 ◽  
pp. 504-509
Author(s):  
Yang Zheng ◽  
Jin Jie Zhou ◽  
Hui Zheng
Keyword(s):  
Wave Scattering ◽  
Scattering Matrix ◽  
Guided Wave ◽  
Defect Characterization ◽  
Challenging Problem ◽  
Recognition Method ◽  
Quantitative Characterization ◽  
S Matrix ◽  
Imaging Algorithms

Although many imaging algorithms such as ellipse and hyperbola algorithm can roughly locate defects in large plate-like structures with sparse guided wave arrays, quantitative characterization of them is still a challenging problem, especially for those small defects known as subwavelength defects. Scattering signals of defects contain abundant information so that can be used to evaluate defects. A defects recognition method using the S-matrix (scattering matrix) was presented. S-matrices of hole and crack with S0 mode incident were experimentally measured. The results show that defects can be recognized from the morphology of 2D S-matrix chart. This method has great potential to achieve more specific parameters of small defects with sparse guided wave arrays.

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