Defect characterization of Cd0.9Zn0.1Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements

2015 ◽  
Author(s):  
Rahmi O. Pak ◽  
Khai V. Nguyen ◽  
Cihan Oner ◽  
Mohammad A. Mannan ◽  
Krishna C. Mandal
Keyword(s):  
Electron Beam ◽  
Defect Characterization ◽  
Induced Current ◽  
Thermally Stimulated Current ◽  
Electron Beam Induced Current

Characterization of 4H-SiC pn Structures with Unstable Excess Current

2015 ◽  
Vol 821-823 ◽  
pp. 648-651
Author(s):  
Anatoly M. Strel'chuk ◽  
Eugene B. Yakimov ◽  
Alexander A. Lavrent’ev ◽  
Evgenia V. Kalinina ◽  
Alexander A. Lebedev
Keyword(s):  
Electron Beam ◽  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Secondary Electron ◽  
Induced Current ◽  
Excess Current ◽  
Forward Current ◽  
Electron Beam Induced Current

4H-SiC p+nn+ structures fabricated by implantation of Al into a commercial n-type 4H-SiC epitaxial layer doped to (3-5)Ÿ1015cm-3 have been studied. Structures with unstable excess forward current were characterized by electron beam induced current (EBIC) and secondary electron (SE) methods and by Auger-electron spectroscopy (AES). Numerous defects were found with a depth which exceed the thickness of the p+-layer. Also, it was demonstrated that the concentration of carbon on the SiC surface always exceeds that of silicon, which may be the reason for the initially unstable conductivity via the defects.

Characterization of GaAs wafers and epilayers with electron‐beam‐induced current, etching, and reflected light

1987 ◽  
Vol 62 (10) ◽  
pp. 4248-4254 ◽  
Author(s):  
L. D. Partain ◽  
S. M. Dean ◽  
B. L. Berard ◽  
P. S. McLeod ◽  
L. M. Fraas ◽  
...  
Keyword(s):  
Electron Beam ◽  
Induced Current ◽  
Reflected Light ◽  
Electron Beam Induced Current

Characterization of 4H semi-insulating silicon carbide single crystals using electron beam induced current

2011 ◽  
Vol 65 (5) ◽  
pp. 911-914 ◽  
Author(s):  
Peter G. Muzykov ◽  
Ramesh Krishna ◽  
Sandip Das ◽  
Timothy Hayes ◽  
Tangali S. Sudarshan ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Electron Beam ◽  
Single Crystals ◽  
Induced Current ◽  
Electron Beam Induced Current
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