Geo-DRS: Geometric Dynamic Range Search on Spatial Data with Backward and Content Privacy

2021 ◽  
pp. 24-43
Author(s):  
Shabnam Kasra Kermanshahi ◽  
Rafael Dowsley ◽  
Ron Steinfeld ◽  
Amin Sakzad ◽  
Joseph K. Liu ◽  
...  
Keyword(s):  
Spatial Data ◽  
Dynamic Range ◽  
Range Search

scholarly journals Performance Evaluation of Range Search Algorithm for k-dSLst Tree

2019 ◽  
Vol 8 (3) ◽  
pp. 4432-4441
Keyword(s):  
Spatial Data ◽  
Search Algorithm ◽  
Range Queries ◽  
Brute Force ◽  
Range Search ◽  
Spatial Objects ◽  
Linked List ◽  
Multiple Dimensions ◽  
Brute Force Method ◽  
Cad Cam

The indexing structures for spatial data are used to organize the data related to spatial objects with respect to their position. These indexing structures are indispensable in various applications like geographic information systems, robotics, computer graphics, CAD/CAM and many more. The range queries related to multiple dimensions are the crucial facet of many spatial applications. In this paper, we are introducing an algorithm kdSLst Objects In Range Search to search for spatial objects within a given range. We will be implementing this algorithm for k-dSLst tree, a spatial indexing tree based on k-d tree and linked list to store spatial data with duplicate keys, which we introduced in our earlier work. The experimental results show that the algorithm kdSLstObjectsInRangeSearch outperforms algorithm bruteForceRangeSearch based on brute force method of searching

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

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