An Analytical Application: Optimization of a Stirling Engine Based on the Schmidt Analysis and on the Adiabatic Analysis

2012 ◽  
pp. 195-224
Author(s):  
Marco Cavazzuti
Author(s):  
Daniele Menniti ◽  
Anna Pinnarelli ◽  
Nicola Sorrentino ◽  
Giuseppe Barone ◽  
Giovanni Brusco ◽  
...  

Author(s):  
T. Nomaguchi ◽  
T. Suganami ◽  
M. Fujiwara ◽  
M. Sakai ◽  
T. Koda ◽  
...  

Author(s):  
Paul Gaffuri ◽  
Ben Mies ◽  
Gregory Cole ◽  
James Van de Ven

Author(s):  
Felipe Pinheiro Maia ◽  
Nícolas M. F. T. S. Araújo ◽  
Gabriel Ivan Medina Tapia

2016 ◽  
Vol 15 (1) ◽  
pp. 133-141
Author(s):  
Ramla Gheith ◽  
Fethi Aloui ◽  
Sassi Ben Nasrallah

Author(s):  
Mayue Xie ◽  
Zhiguo Qian ◽  
Mario Pacheco ◽  
Zhiyong Wang ◽  
Rajen Dias ◽  
...  

Abstract Recently, a new approach for isolation of open faults in integrated circuits (ICs) was developed. It is based on mapping the radio-frequency (RF) magnetic field produced by the defective part fed with RF probing current, giving the name to Space Domain Reflectometry (SDR). SDR is a non-contact and nondestructive technique to localize open defects in package substrates, interconnections and semiconductor devices. It provides 2D failure isolation capability with defect localization resolution down to 50 microns. It is also capable of scanning long traces in Si. This paper describes the principles of the SDR and its application for the localization of open and high resistance defects. It then discusses some analysis methods for application optimization, and gives examples of test samples as well as case studies from actual failures.


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