On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors

VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design - IFIP Advances in Information and Communication Technology ◽

10.1007/978-3-642-45073-0_9 ◽

2013 ◽

pp. 162-180 ◽

Author(s):

Davide Sabena ◽

Luca Sterpone ◽

Matteo Sonza Reorda

Keyword(s):

Automatic Generation ◽

Functional Test ◽

Vliw Processors ◽

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On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2252636 ◽

2014 ◽

Vol 22 (4) ◽

pp. 813-823 ◽

Author(s):

Davide Sabena ◽

Matteo Sonza Reorda ◽

Luca Sterpone

Keyword(s):

Automatic Generation ◽

Vliw Processors ◽

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Automatic generation of memory built-in self-test cores for system-on-chip

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990265 ◽

2002 ◽

Author(s):

Kuo-Liang Cheng ◽

Chia-Ming Hsueh ◽

Jing-Reng Huang ◽

Jen-Chieh Yeh ◽

Chih-Tsun Huang ◽

...

Keyword(s):

Automatic Generation ◽

System On Chip ◽

Self Test ◽

Built In Self Test ◽

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On the optimized generation of Software-Based Self-Test programs for VLIW processors

2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) ◽

10.1109/vlsi-soc.2012.7332089 ◽

2012 ◽

Author(s):

D. Sabena ◽

M. Sonza Reorda ◽

L. Sterpone

Keyword(s):

Vliw Processors ◽

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A software-based self-test and hardware reconfiguration solution for VLIW processors

13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems ◽

10.1109/ddecs.2010.5491821 ◽

2010 ◽

Author(s):

Tobias Koal ◽

Heinrich Theodor Vierhaus

Keyword(s):

Vliw Processors ◽

Self Test ◽

Hardware Reconfiguration

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On the development of Software-Based Self-Test methods for VLIW processors

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378194 ◽

2012 ◽

Author(s):

D. Sabena ◽

M. Sonza Reorda ◽

L. Sterpone

Keyword(s):

Test Methods ◽

Vliw Processors ◽

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The automatic generation of functional test vectors for Rambus designs

33rd Design Automation Conference Proceedings, 1996 ◽

10.1109/dac.1996.545612 ◽

2005 ◽

Author(s):

K.D. Jones ◽

J.P. Privitera

Keyword(s):

Automatic Generation ◽

Functional Test ◽

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The automatic generation of functional test vectors for Rambus designs

33rd Design Automation Conference Proceedings, 1996 ◽

10.1145/240518.240598 ◽

1996 ◽

Author(s):

K. D. Jones ◽

J. P. Privitera

Keyword(s):

Automatic Generation ◽

Functional Test ◽

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On the optimized generation of Software-Based Self-Test programs for VLIW processors

2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) ◽

10.1109/vlsi-soc.2012.6379018 ◽

2012 ◽

Author(s):

D. Sabena ◽

M. Sonza Reorda ◽

L. Sterpone

Keyword(s):

Vliw Processors ◽

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A new framework for automatic generation, insertion and verification of memory built-in self test units

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) ◽

10.1109/vtest.1999.766694 ◽

2003 ◽

Author(s):

K. Zarrineh ◽

S.J. Upadhyaya

Keyword(s):

Automatic Generation ◽

Self Test ◽

Built In Self Test ◽

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Automatic generation of functional test pattern for the SCHOLAR system

10.1109/ciccas.1991.184443 ◽

2002 ◽

Author(s):

Mike Wai-Tak Wong ◽

K.G. Nichols

Keyword(s):

Test Pattern ◽

Automatic Generation ◽

Functional Test

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