2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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Published By IEEE

9781467330442, 9781467330435, 9781467330428

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Transient pulse propagation using the Weibull distribution function

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378209 ◽

2012 ◽

Cited By ~ 1

Author(s):

Adam Watkins ◽

Spyros Tragoudas

Keyword(s):

Distribution Function ◽

Weibull Distribution ◽

Pulse Propagation ◽

Weibull Distribution Function

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Path-delay fingerprinting for identification of recovered ICs

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378192 ◽

2012 ◽

Cited By ~ 46

Author(s):

Xuehui Zhang ◽

Kan Xiao ◽

Mohammad Tehranipoor

Keyword(s):

Path Delay

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High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378211 ◽

2012 ◽

Cited By ~ 1

Author(s):

C. Bolchini ◽

A. Miele ◽

C. Sandionigi ◽

M. Ottavi ◽

S. Pontarelli ◽

...

Keyword(s):

Fault Tolerant ◽

High Reliability ◽

Digital Systems ◽

Design Methodologies

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A low overhead built-in delay testing with voltage and frequency adaptation for variation resilience

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378219 ◽

2012 ◽

Cited By ~ 1

Author(s):

Kyu-Nam Shim ◽

Jiang Hu

Keyword(s):

Delay Testing ◽

Frequency Adaptation

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Improving small-delay fault coverage for on-chip delay measurement

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378223 ◽

2012 ◽

Cited By ~ 4

Author(s):

Wenpo Zhang ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Delay Measurement ◽

Small Delay ◽

On Chip

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Parametric counterfeit IC detection via Support Vector Machines

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378191 ◽

2012 ◽

Cited By ~ 29

Author(s):

Ke Huang ◽

John M Carulli ◽

Yiorgos Makris

Keyword(s):

Support Vector Machines ◽

Support Vector ◽

Vector Machines

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On the development of Software-Based Self-Test methods for VLIW processors

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378194 ◽

2012 ◽

Cited By ~ 7

Author(s):

D. Sabena ◽

M. Sonza Reorda ◽

L. Sterpone

Keyword(s):

Test Methods ◽

Vliw Processors ◽

Self Test

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A novel pseudonoise tester for transmission line fault location and identification using pseudorandom binary sequences

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378228 ◽

2012 ◽

Cited By ~ 3

Author(s):

Richard A. Guinee

Keyword(s):

Transmission Line ◽

Fault Location ◽

Binary Sequences

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Modeling SRAM start-up behavior for Physical Unclonable Functions

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378190 ◽

2012 ◽

Cited By ~ 31

Author(s):

Mafalda Cortez ◽

Apurva Dargar ◽

Said Hamdioui ◽

Geert-Jan Schrijen

Keyword(s):

Physical Unclonable Functions ◽

Start Up

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A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378197 ◽

2012 ◽

Cited By ~ 4

Author(s):

Jean Da Rolt ◽

Amitabh Das ◽

Giorgio Di Natale ◽

Mane-Lise Flottes ◽

Bruno Rouzeyre ◽

...

Keyword(s):

Elliptic Curve ◽

Industrial Design ◽

Design For Testability ◽

Elliptic Curve Cryptosystems

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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Transient pulse propagation using the Weibull distribution function

Path-delay fingerprinting for identification of recovered ICs

High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies

A low overhead built-in delay testing with voltage and frequency adaptation for variation resilience

Improving small-delay fault coverage for on-chip delay measurement

Parametric counterfeit IC detection via Support Vector Machines

On the development of Software-Based Self-Test methods for VLIW processors

A novel pseudonoise tester for transmission line fault location and identification using pseudorandom binary sequences

Modeling SRAM start-up behavior for Physical Unclonable Functions

A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Latest Publications