Diffusible Ion Localization in Biological Tissue by Ion Microscopy

Microprobe analysis of biological tissue is now in the end phase of transition from instrumental and technique development to applications pertinent to questions of physiological relevance. The promise,implicit in early investigative efforts, is being fulfilled to an extent much greater than many had predicted. It would thus seem appropriate to briefly report studies exemplifying this, ∿. In general, the distributions of ions in tissue in a preselected physiological state produced by variations in the external environment is of importance in elucidating the mechanisms of exchange and regulation of these ions.

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Field-Ion Microscopy of BCC Metals: A Study of Image Differences and Topographical Variations

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071016 ◽

1973 ◽

Vol 31 ◽

pp. 114-115

Author(s):

O. T. Inal ◽

L. E. Murr

Keyword(s):

Liquid Nitrogen ◽

Liquid Nitrogen Temperature ◽

Surface Atom ◽

Image Brightness ◽

Field Ion Microscopy ◽

Topographic Features ◽

Bcc Metals ◽

Electron Orbital ◽

Ion Microscopy ◽

Field Ion Microscope

When sharp metal filaments of W, Fe, Nb or Ta are observed in the field-ion microscope (FIM), their appearance is differentiated primarily by variations in regional brightness. This regional brightness, particularly prominent at liquid nitrogen temperature has been attributed in the main to chemical specificity which manifests itself in a paricular array of surface-atom electron-orbital configurations.Recently, anomalous image brightness and streaks in both fcc and bee materials observed in the FIM have been shown to be the result of surface asperities and related topographic features which arise by the unsystematic etching of the emission-tip end forms.

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First H+ Charge-Exchange Images in the Stim.

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092487 ◽

1976 ◽

Vol 34 ◽

pp. 504-505

Author(s):

Wm. H. Escovitz ◽

T. R. Fox ◽

R. Levi-Setti

Keyword(s):

Charge Exchange ◽

Neutral Component ◽

Channel Electron Multiplier ◽

Electron Multiplier ◽

Neutral Particles ◽

Charged Beam ◽

Scanning Transmission ◽

Contrast Mechanism ◽

Ion Microscopy ◽

Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

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Field ion microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100104236 ◽

1988 ◽

Vol 46 ◽

pp. 434-435

Author(s):

Gert Ehrlich

Keyword(s):

Low Temperature ◽

Sample Surface ◽

Low Pressure ◽

Radius Of Curvature ◽

Field Ion Microscopy ◽

Phosphor Screen ◽

Ion Microscopy ◽

Field Ion Microscope

The field ion microscope, devised by Erwin Muller in the 1950's, was the first instrument to depict the structure of surfaces in atomic detail. An FIM image of a (111) plane of tungsten (Fig.l) is typical of what can be done by this microscope: for this small plane, every atom, at a separation of 4.48Å from its neighbors in the plane, is revealed. The image of the plane is highly enlarged, as it is projected on a phosphor screen with a radius of curvature more than a million times that of the sample. Müller achieved the resolution necessary to reveal individual atoms by imaging with ions, accommodated to the object at a low temperature. The ions are created at the sample surface by ionization of an inert image gas (usually helium), present at a low pressure (< 1 mTorr). at fields on the order of 4V/Å.

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On the Shape of Field-Ion Emitters

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092566 ◽

1976 ◽

Vol 34 ◽

pp. 520-521

Author(s):

H.C. Eaton ◽

B.N. Ranganathan ◽

T.W. Burwinkle ◽

R. J. Bayuzick ◽

J.J. Hren

Keyword(s):

Grain Boundary ◽

Spherical Shape ◽

Theoretical Strength ◽

Evaporation Process ◽

Field Evaporation ◽

Geometric Information ◽

Field Ion Microscopy ◽

Considerable Error ◽

True Shape ◽

Ion Microscopy

The shape of the emitter is of cardinal importance to field-ion microscopy. First, the field evaporation process itself is closely related to the initial tip shape. Secondly, the imaging stress, which is near the theoretical strength of the material and intrinsic to the imaging process, cannot be characterized without knowledge of the emitter shape. Finally, the problem of obtaining quantitative geometric information from the micrograph cannot be solved without knowing the shape. Previously published grain-boundary topographies were obtained employing an assumption of a spherical shape (1). The present investigation shows that the true shape deviates as much as 100 Å from sphericity and boundary reconstructions contain considerable error as a result.Our present procedures for obtaining tip shape may be summarized as follows. An empirical projection, D=f(θ), is obtained by digitizing the positions of poles on a field-ion micrograph.

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Scanning ion microscopy images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010012583x ◽

1987 ◽

Vol 45 ◽

pp. 180-181

Author(s):

R. Levi-Setti ◽

J.M. Chabala ◽

Y.L. Wang

Keyword(s):

Metal Ion ◽

Secondary Emission ◽

Scanning Method ◽

Ion Channeling ◽

Secondary Ions ◽

High Resolution Images ◽

Ion Microscopy ◽

Z Contrast ◽

Focused Beams ◽

Microscopy Images

Finely focused beams extracted from liquid metal ion sources (LMIS) provide a wealth of secondary signals which can be exploited to create high resolution images by the scanning method. The images of scanning ion microscopy (SIM) encompass a variety of contrast mechanisms which we classify into two broad categories: a) Emission contrast and b) Analytical contrast.Emission contrast refers to those mechanisms inherent to the emission of secondaries by solids under ion bombardment. The contrast-carrying signals consist of ion-induced secondary electrons (ISE) and secondary ions (ISI). Both signals exhibit i) topographic emission contrast due to the existence of differential geometric emission and collection effects, ii) crystallographic emission contrast, due to primary ion channeling phenomena and differential oxidation of crystalline surfaces, iii) chemical emission or Z-contrast, related to the dependence of the secondary emission yields on the Z and surface chemical state of the target.

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Complementary Z-Contrast Imaging and Digital Image Processing

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100118394 ◽

1985 ◽

Vol 43 ◽

pp. 304-305

Author(s):

K. N. Colonna ◽

G. Oliphant

Keyword(s):

Image Processing ◽

Heavy Metal ◽

Digital Image Processing ◽

Digital Image ◽

Biological Tissue ◽

Biological Imaging ◽

Tissue Preparation ◽

Contrast Imaging ◽

Imaging Tool ◽

Z Contrast

Harmonious use of Z-contrast imaging and digital image processing as an analytical imaging tool was developed and demonstrated in studying the elemental constitution of human and maturing rabbit spermatozoa. Due to its analog origin (Fig. 1), the Z-contrast image offers information unique to the science of biological imaging. Despite the information and distinct advantages it offers, the potential of Z-contrast imaging is extremely limited without the application of techniques of digital image processing. For the first time in biological imaging, this study demonstrates the tremendous potential involved in the complementary use of Z-contrast imaging and digital image processing.Imaging in the Z-contrast mode is powerful for three distinct reasons, the first of which involves tissue preparation. It affords biologists the opportunity to visualize biological tissue without the use of heavy metal fixatives and stains. For years biologists have used heavy metal components to compensate for the limited electron scattering properties of biological tissue.

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An Improved Method for the Preparation and TEM Examination of Sharp Pointed Tips used in APFIM and STM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100134107 ◽

1990 ◽

Vol 48 (2) ◽

pp. 102-103

Author(s):

E.A. Fischione ◽

P.E. Fischione ◽

J.J. Haugh ◽

M.G. Burke

Keyword(s):

Atom Probe ◽

Preparation Process ◽

Improved Method ◽

Ion Milling ◽

Polishing Process ◽

Probe Field ◽

Scanning Tunnelling ◽

Stm Tips ◽

Tunnelling Microscopy ◽

Ion Microscopy

A common requirement for both Atom Probe Field-Ion Microscopy (APFIM) and Scanning Tunnelling Microscopy (STM) is a sharp pointed tip for use as either the specimen (APFIM) or the probe (STM). Traditionally, tips have been prepared by either chemical or electropolishing techniques. Recently, ion-milling has been successfully employed in the production of APFIM tips [1]. Conventional electropolishing techniques are applicable to a wide variety of metals, but generally require careful manual adjustments during the polishing process and may also be time-consuming. In order to reduce the time and effort involved in the preparation process, a compact, self-contained polishing unit has been developed. This system is based upon the conventional two-stage electropolishing technique in which the specimen/tip blank is first locally thinned or “necked”, and subsequently electropolished until separation occurs.[2,3] The result of this process is the production of two APFIM or STM tips. A mechanized polishing unit that provides these functions while automatically maintaining alignment has been designed and developed.

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