Generation of Surface Microstructure in Metals and Semiconductors by Short Pulse CO2 Lasers

1983 ◽  
pp. 212-215 ◽  
Author(s):  
J. F. Figueira ◽  
S. J. Thomas
Keyword(s):  
Short Pulse ◽  
Surface Microstructure ◽  
Co2 Lasers

High-Energy Short-Pulse CO2 Lasers

2018 ◽  
pp. 259-321
Author(s):  
Joseph F. Figueira
Keyword(s):  
Short Pulse ◽  
High Energy ◽  
Co2 Lasers

Enhanced peak power and short pulse operation of planar waveguide CO2 lasers

2001 ◽  
Vol 78 (16) ◽  
pp. 2276-2278 ◽  
Author(s):  
F. Villarreal ◽  
P. R. Murray ◽  
H. J. Baker ◽  
D. R. Hall
Keyword(s):  
Planar Waveguide ◽  
Peak Power ◽  
Short Pulse ◽  
Co2 Lasers ◽  
Pulse Operation ◽  
Waveguide Co2 Lasers

Preparation of Backthinned Ceramic Specimens

1985 ◽  
Vol 43 ◽  
pp. 182-183
Author(s):  
A. T. Fisher ◽  
P. Angelini
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Vacuum System ◽  
Back Surface ◽  
Surface Microstructure ◽  
Ion Milling ◽  
Near Surface ◽  
Depth Profiles ◽  
Analytical Electron ◽  
Ion Implanted

Analytical electron microscopy (AEM) of the near surface microstructure of ion implanted ceramics can provide much information about these materials. Backthinning of specimens results in relatively large thin areas for analysis of precipitates, voids, dislocations, depth profiles of implanted species and other features. One of the most critical stages in the backthinning process is the ion milling procedure. Material sputtered during ion milling can redeposit on the back surface thereby contaminating the specimen with impurities such as Fe, Cr, Ni, Mo, Si, etc. These impurities may originate from the specimen, specimen platform and clamping plates, vacuum system, and other components. The contamination may take the form of discrete particles or continuous films [Fig. 1] and compromises many of the compositional and microstructural analyses. A method is being developed to protect the implanted surface by coating it with NaCl prior to backthinning. Impurities which deposit on the continuous NaCl film during ion milling are removed by immersing the specimen in water and floating the contaminants from the specimen as the salt dissolves.

Multiphoton ionization by a very short pulse

2017 ◽  
Vol 187 (11) ◽  
pp. 1280-1287 ◽  
Author(s):  
Leonid V. Keldysh
Keyword(s):  
Short Pulse ◽  
Multiphoton Ionization
Sign in / Sign up

Export Citation Format

Share Document