Structural Characterization of Supported Planar Bilayers by Using Infrared Spectroscopy and Atomic Force Microscopy
2020 ◽
Vol 92
(10)
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pp. 6806-6810
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1997 ◽
Vol 101
(33)
◽
pp. 6372-6378
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Keyword(s):
2007 ◽
Vol 20
(6)
◽
pp. 546-553
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