Scanning Probe Microscopy Characterization of Cluster Systems

Low-Dimensional Systems: Theory, Preparation, and Some Applications ◽

10.1007/978-94-010-0143-4_20 ◽

2003 ◽

pp. 253-265

Author(s):

Wanda Polewska ◽

Ryszard Czajka ◽

Jarosław Gutek ◽

T. Hihara ◽

A. Kasuya

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Cluster Systems ◽

Probe Microscopy ◽

Microscopy Characterization

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Scanning probe microscopy characterization of gold-chemisorbed poplar plastocyanin mutants

Surface Science ◽

10.1016/s0039-6028(03)00443-6 ◽

2003 ◽

Vol 530 (3) ◽

pp. 181-194 ◽

Author(s):

L. Andolfi ◽

B. Bonanni ◽

G.W. Canters ◽

M.Ph. Verbeet ◽

S. Cannistraro

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Characterization

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Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_17 ◽

2005 ◽

pp. 363-369

Author(s):

C. Canalias ◽

R. Clemens ◽

J. Hellström ◽

F. Laurell ◽

J. Wittborn ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Characterization

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Light-assisted scanning probe microscopy characterization of the electrical properties of AlGaN/GaN/Si heterostructures

Applied Surface Science ◽

10.1016/j.apsusc.2020.148189 ◽

2021 ◽

Vol 538 ◽

pp. 148189

Author(s):

Adam Szyszka ◽

Mateusz Wośko ◽

Regina Paszkiewicz

Keyword(s):

Electrical Properties ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Characterization

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Scanning Probe Microscopy Characterization of Optical Thin Films

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_11 ◽

2018 ◽

pp. 315-339

Author(s):

Petr Klapetek

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Characterization

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Scanning Probe Microscopy Characterization of Single Chains Based on a One-Dimensional Oxalato-Bridged Manganese(II) Complex with 4-Aminotriazole

Inorganic Chemistry ◽

10.1021/ic0505302 ◽

2005 ◽

Vol 44 (23) ◽

pp. 8343-8348 ◽

Author(s):

Urko García-Couceiro ◽

David Olea ◽

Oscar Castillo ◽

Antonio Luque ◽

Pascual Román ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

One Dimensional ◽

Probe Microscopy ◽

Microscopy Characterization

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Characterization of periodically poled ferroelectric crystals using scanning probe microscopy

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) ◽

10.1109/cleo.2001.947615 ◽

2001 ◽

Author(s):

R. Clemens ◽

F. Laurell ◽

H. Karlsson ◽

J. Wittborn ◽

C. Canalias ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Periodically Poled ◽

Probe Microscopy ◽

Ferroelectric Crystals

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Characterization of CVD-synthesized graphene films transferred on different substrates using the scanning probe microscopy electrical techniques

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2021.115101 ◽

2021 ◽

pp. 115101

Author(s):

Yu.V. Korkh ◽

A.B. Rinkevich ◽

A.S. Klepikova ◽

E.A. Tolmacheva ◽

E.A. Pankrushina

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

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Characterization of thermally oxidized carbon fibre surfaces by ESCA, wetting techniques and scanning probe microscopy, and the interaction with polyethylmethacrylate. Development of a biocompatible composite material

10.1016/0010-4361(94)90213-5 ◽

1994 ◽

Vol 25 (7) ◽

pp. 763-769 ◽

Author(s):

J. Mayer ◽

S. Giorgetta ◽

B. Koch ◽

E. Wintermantel ◽

J. Patscheider ◽

...

Keyword(s):

Composite Material ◽

Carbon Fibre ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Oxidized Carbon

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Electrical characterization of semiconductor nanowires by scanning-probe microscopy

Semiconductor Nanowires ◽

10.1016/b978-1-78242-253-2.00010-4 ◽

2015 ◽

pp. 277-304 ◽

Author(s):

T. Xu ◽

B. Grandidier

Keyword(s):

Scanning Probe Microscopy ◽

Electrical Characterization ◽

Semiconductor Nanowires ◽

Scanning Probe ◽

Probe Microscopy

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Characterization of Catalysts by Advanced Scanning Probe Microscopy and Spectroscopy

ChemCatChem ◽

10.1002/cctc.201901877 ◽

2020 ◽

Vol 12 (14) ◽

pp. 3601-3620

Author(s):

Yao Sun ◽

Kaiyang Zeng

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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