Characterization of CVD-synthesized graphene films transferred on different substrates using the scanning probe microscopy electrical techniques

2021 ◽  
pp. 115101
Author(s):  
Yu.V. Korkh ◽  
A.B. Rinkevich ◽  
A.S. Klepikova ◽  
E.A. Tolmacheva ◽  
E.A. Pankrushina
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Graphene Films

Quality Characterization of CVD-Synthesized Graphene Films by Scanning Probe Microscopy

2020 ◽  
Vol 65 (10) ◽  
pp. 362-365
Author(s):  
A. B. Rinkevich ◽  
Yu. V. Korkh ◽  
A. S. Klepikova ◽  
E. A. Tolmacheva
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Graphene Films

scholarly journals Nanoscale Characterization of Silicon-On-Insulator Nanowires by Multimode Scanning Probe Microscopy

2013 ◽  
Vol 38 (2) ◽  
pp. 265-268
Author(s):  
Leonid Bolotov ◽  
Tetsuya Tada ◽  
Yukinori Morita ◽  
Vladimir Poborchii ◽  
Toshihiko Kanayama
Keyword(s):  
Scanning Probe Microscopy ◽  
Silicon On Insulator ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoscale Characterization

Characterization of vertical RESURF diodes using scanning probe microscopy

2003 ◽  
Vol 102 (1-3) ◽  
pp. 143-147 ◽  
Author(s):  
N. Duhayon ◽  
M. Xu ◽  
W. Vandervorst ◽  
L. Hellemans ◽  
C. Rochefort ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
Sign in / Sign up

Export Citation Format

Share Document