Characterization of periodically poled ferroelectric crystals using scanning probe microscopy

2001 ◽  
Author(s):  
R. Clemens ◽  
F. Laurell ◽  
H. Karlsson ◽  
J. Wittborn ◽  
C. Canalias ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Periodically Poled ◽  
Probe Microscopy ◽  
Ferroelectric Crystals

scholarly journals Nanoscale Characterization of Silicon-On-Insulator Nanowires by Multimode Scanning Probe Microscopy

2013 ◽  
Vol 38 (2) ◽  
pp. 265-268
Author(s):  
Leonid Bolotov ◽  
Tetsuya Tada ◽  
Yukinori Morita ◽  
Vladimir Poborchii ◽  
Toshihiko Kanayama
Keyword(s):  
Scanning Probe Microscopy ◽  
Silicon On Insulator ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoscale Characterization

Characterization of vertical RESURF diodes using scanning probe microscopy

2003 ◽  
Vol 102 (1-3) ◽  
pp. 143-147 ◽  
Author(s):  
N. Duhayon ◽  
M. Xu ◽  
W. Vandervorst ◽  
L. Hellemans ◽  
C. Rochefort ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
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