Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry

AFM Patterning of SrTiO3−δ Thin Films and Device Applications

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_19 ◽

2005 ◽

pp. 387-398

Author(s):

L. Pellegrino

Keyword(s):

Thin Films ◽

Device Applications

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Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_12 ◽

2005 ◽

pp. 275-287 ◽

Cited By ~ 1

Author(s):

L.M. Eng

Keyword(s):

Thin Films ◽

Pzt Thin Films

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SFM-Based Methods for Ferroelectric Studies

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_10 ◽

2005 ◽

pp. 223-249 ◽

Cited By ~ 1

Author(s):

A. Gruverman

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Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_29 ◽

2005 ◽

pp. 475-483

Author(s):

Z.V. Leonenko ◽

D.T. Cramb

Keyword(s):

Atomic Force Microscopy ◽

Model Membranes ◽

Force Microscopy ◽

Atomic Force ◽

Temperature Controlled

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Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_17 ◽

2005 ◽

pp. 363-369

Author(s):

C. Canalias ◽

R. Clemens ◽

J. Hellström ◽

F. Laurell ◽

J. Wittborn ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Characterization

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Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_6 ◽

2005 ◽

pp. 119-151 ◽

Cited By ~ 1

Author(s):

Y. Rosenwaks ◽

R. Shikler

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_25 ◽

2005 ◽

pp. 443-448

Author(s):

A. Rinkevich ◽

L. Romashev ◽

V. Ustinov

Keyword(s):

Surface Relief ◽

Electromagnetic Waves

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Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_9 ◽

2005 ◽

pp. 199-222

Author(s):

S.V. Kalinin ◽

D.A. Bonnell

Keyword(s):

Scanning Probe Microscopy ◽

Transport Phenomena ◽

Scanning Probe ◽

Probe Microscopy

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Nanoscale Investigation of a Rayleigh Wave on LiNbO3

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_20 ◽

2005 ◽

pp. 399-404

Author(s):

J. Yang ◽

R. Koch

Keyword(s):

Rayleigh Wave

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Expanding the Capabilities of the Scanning Tunneling Microscope

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry ◽

10.1007/1-4020-3019-3_7 ◽

2005 ◽

pp. 153-171

Author(s):

K.F. Kelly ◽

Z.J. Donhauser ◽

B.A. Mantooth ◽

P.S. Weiss

Keyword(s):

Scanning Tunneling Microscope ◽

Scanning Tunneling ◽

Tunneling Microscope

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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Kluwer Academic Publishers

AFM Patterning of SrTiO3−δ Thin Films and Device Applications

Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films

SFM-Based Methods for Ferroelectric Studies

Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy

Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4

Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy

Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration

Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials

Nanoscale Investigation of a Rayleigh Wave on LiNbO3

Expanding the Capabilities of the Scanning Tunneling Microscope

Export Citation Format

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and ChemistryLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Kluwer Academic Publishers

AFM Patterning of SrTiO3−δ Thin Films and Device Applications

Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films

SFM-Based Methods for Ferroelectric Studies

Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy

Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4

Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy

Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration

Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials

Nanoscale Investigation of a Rayleigh Wave on LiNbO3

Expanding the Capabilities of the Scanning Tunneling Microscope

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials - NATO Science Series II: Mathematics, Physics and Chemistry
Latest Publications