Neutron and X-Ray Scattering of Fluids at High Pressure and High Temperature

1993 ◽  
pp. 167-199
Author(s):  
R. Winter
Keyword(s):  
High Pressure ◽  
High Temperature ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Sound velocity measurements of hcp Fe-Si alloy at high pressure and high temperature by inelastic X-ray scattering

2018 ◽  
Vol 103 (1) ◽  
pp. 85-90 ◽  
Author(s):  
Takanori Sakairi ◽  
Tatsuya Sakamaki ◽  
Eiji Ohtani ◽  
Hiroshi Fukui ◽  
Seiji Kamada ◽  
...  
Keyword(s):  
High Pressure ◽  
High Temperature ◽  
Sound Velocity ◽  
Velocity Measurements ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Sound velocity of Fe3C at high pressure and high temperature determined by inelastic X-ray scattering

2019 ◽  
Vol 351 (2-3) ◽  
pp. 190-196 ◽  
Author(s):  
Suguru Takahashi ◽  
Eiji Ohtani ◽  
Tatsuya Sakamaki ◽  
Seiji Kamada ◽  
Hiroshi Fukui ◽  
...  
Keyword(s):  
High Pressure ◽  
High Temperature ◽  
Sound Velocity ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Inelastic x-ray scattering measurements of dynamical cross-over in liquid As2Se3 at high temperature and high pressure

2011 ◽  
Vol 196 (1) ◽  
pp. 167-174 ◽  
Author(s):  
M. Inui ◽  
Y. Kajihara ◽  
K. Matsuda ◽  
S. Hosokawa ◽  
K. Tamura ◽  
...  
Keyword(s):  
High Pressure ◽  
High Temperature ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

Raman and X-Ray Scattering Studies of High-Pressure Phases of Urea

2005 ◽  
Vol 109 (16) ◽  
pp. 8206-8215 ◽  
Author(s):  
F. J. Lamelas ◽  
Z. A. Dreger ◽  
Y. M. Gupta
Keyword(s):  
High Pressure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Inelastic x-ray scattering by electronic excitations under high pressure

2010 ◽  
Vol 82 (1) ◽  
pp. 847-896 ◽  
Author(s):  
Jean-Pascal Rueff ◽  
Abhay Shukla
Keyword(s):  
High Pressure ◽  
Electronic Excitations ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Grazing Incidence X-Ray Scattering Studies of the Structure and Morphology of the Ni/Mgo(001), Co/Nio(111) and Nife/Nio(111) Interfaces During their in Situ Growth

1999 ◽  
Vol 562 ◽  
Author(s):  
G. Renaud ◽  
A. Barbier ◽  
C. Mocuta
Keyword(s):  
High Temperature ◽  
Magnetic Measurements ◽  
Grazing Incidence ◽  
Ex Situ ◽  
Crystallographic Structure ◽  
Temperature Oxidation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTCombined in situ structural and ex situ magnetic studies of the Co/NiO(111) and Ni81Fe19/NiO(111) interfaces are presented. The Co and Permalloy films were grown on NiO(111) single crystals. Structural studies were performed by Grazing Incidence X-ray Scattering during growth. The effect of the temperature of the substrate during deposition was investigated. Under specific growth conditions, almost pure FCC Co and NiFe films can be obtained, with small quantities of twins. Magnetic measurements were performed ex situ by Magneto-Optical Kerr Effect (MOKE). A strong correlation between the magnetic properties and the crystallographic structure of the Co film is evidenced. High coercive fields are measured for all samples. High temperature annealing of the NiFe film leads to an improved crystalline quality, but the interface becomes reactive and diffuse: part of the Fe diffuses into the NiO substrate and forms an interface compound, likely to be the spinel NiFe2O4. We also report an in situ grazing incidence X-ray scattering study of the Ni/MgO(001) interface during its formation at room temperature. In-plane measurements reveal that the interface is sharp and that the epitaxial relationship is complex. Two distinct lattices are found to exist: expanded Ni(001) and Ni(110). The latter exhibits several orientations with respect to the substrate depending on the thickness. The Ni(110) orientations disappear by annealing at high temperature, leaving only the Ni cube/cube orientation. The layer was also almost fully transformed into NiO(001) by high temperature oxidation.

High-pressure developments for resonant X-ray scattering experiments at I16

2020 ◽  
Vol 27 (2) ◽  
pp. 351-359
Author(s):  
I. Povedano ◽  
A. Bombardi ◽  
D. G. Porter ◽  
M. Burt ◽  
S. Green ◽  
...  
Keyword(s):  
High Pressure ◽  
Low Temperature ◽  
The Body ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Geometry ◽  
Diamond Anvil ◽  
Membrane Cell ◽  
Ray Scattering

An experimental setup to perform high-pressure resonant X-ray scattering (RXS) experiments at low temperature on I16 at Diamond Light Source is presented. The setup consists of a membrane-driven diamond anvil cell, a panoramic dome and an optical system that allows pressure to be measured in situ using the ruby fluorescence method. The membrane cell, inspired by the Merrill–Bassett design, presents an asymmetric layout in order to operate in a back-scattering geometry, with a panoramic aperture of 100° in the top and a bottom half dedicated to the regulation and measurement of pressure. It is specially designed to be mounted on the cold finger of a 4 K closed-cycle cryostat and actuated at low-temperature by pumping helium into the gas membrane. The main parts of the body are machined from a CuBe alloy (BERYLCO 25) and, when assembled, it presents an approximate height of 20–21 mm and fits into a 57 mm diameter. This system allows different materials to be probed using RXS in a range of temperatures between 30 and 300 K and has been tested up to 20 GPa using anvils with a culet diameter of 500 µm under quasi-cryogenic conditions. Detailed descriptions of different parts of the setup, operation and the developed methodology are provided here, along with some preliminary experimental results.

Polyamorphic Amorphous Silicon at High Pressure: Raman and Spatially Resolved X-ray Scattering and Molecular Dynamics Studies

2011 ◽  
Vol 115 (48) ◽  
pp. 14246-14255 ◽  
Author(s):  
Dominik Daisenberger ◽  
Thierry Deschamps ◽  
Bernard Champagnon ◽  
Mohamed Mezouar ◽  
Raúl Quesada Cabrera ◽  
...  
Keyword(s):  
Molecular Dynamics ◽  
High Pressure ◽  
Amorphous Silicon ◽  
X Ray ◽  
Spatially Resolved ◽  
X Ray Scattering ◽  
Ray Scattering
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