The Interface Between TiN Coatings and AISI 304 Steel Substrates for Different Deposition Conditions: A Transmission Electron Microscopy Study

Interfaces in New Materials ◽

10.1007/978-94-011-3680-8_26 ◽

1991 ◽

pp. 262-269

Author(s):

Jan D’Haen ◽

L. De Schepper ◽

M. Van Stappen ◽

L. M. Stals

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Aisi 304 ◽

Tin Coatings ◽

Transmission Electron ◽

Aisi 304 Steel ◽

Steel Substrates

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

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In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A scanning electron microscopy/transmission electron microscopy study of the photocrystallization of amorphous silicon

Journal of Applied Physics ◽

10.1063/1.331800 ◽

1983 ◽

Vol 54 (10) ◽

pp. 5760-5763 ◽

Author(s):

A. Prasad ◽

K. Ebihara ◽

P. K. John ◽

B. Y. Tong ◽

S. K. Wong ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

Amorphous Silicon ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

Scanning Electron

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A transmission electron microscopy study of lattice defects in Mn3O4 hausmannite

Philosophical Magazine B ◽

10.1080/01418639408240274 ◽

1994 ◽

Vol 70 (5) ◽

pp. 1077-1094 ◽

Author(s):

J. J. Couderc ◽

S. Fritsch ◽

M. Brieu ◽

G. Vanderschaeve ◽

M. Fagot ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Lattice Defects ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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High‐resolution transmission electron microscopy study of solid phase crystallized silicon thin films on SiO2: Crystal growth and defects formation

Journal of Applied Physics ◽

10.1063/1.359359 ◽

1995 ◽

Vol 77 (1) ◽

pp. 95-102 ◽

Author(s):

J. H. Kim ◽

J. Y. Lee ◽

K. S. Nam

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Crystal Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Silicon Thin Films ◽

Transmission Electron

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Oblique growth of iron thin films on glass: a cross-sectional transmission electron microscopy study

Thin Solid Films ◽

10.1016/0040-6090(95)06552-0 ◽

1995 ◽

Vol 263 (1) ◽

pp. 42-46 ◽

Author(s):

P. Fréchard ◽

S. Andrieu ◽

D. Chateigner ◽

M. Hallouis ◽

P. Germi ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Cross Sectional ◽

Transmission Electron

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