Backside Illuminated Pixel Detectors

Author(s):  
L. Strüder ◽  
R. Hartmann ◽  
P. Klein ◽  
N. Krause ◽  
G. Lutz ◽  
...  
2002 ◽  
Vol 12 (6) ◽  
pp. 385-390 ◽  
Author(s):  
J.-F. Bérar ◽  
L. Blanquart ◽  
N. Boudet ◽  
P. Breugnon ◽  
B. Caillot ◽  
...  

Author(s):  
M. Palaniappan ◽  
V. Ng ◽  
R. Heiderhoff ◽  
J.C.H. Phang ◽  
G.B.M. Fiege ◽  
...  

Abstract Light emission and heat generation of Si devices have become important in understanding physical phenomena in device degradation and breakdown mechanisms. This paper correlates the photon emission with the temperature distribution of a short channel nMOSFET. Investigations have been carried out to localize and characterize the hot spots using a spectroscopic photon emission microscope and a scanning thermal microscope. Frontside investigations have been carried out and are compared and discussed with backside investigations. A method has been developed to register the backside thermal image with the backside illuminated image.


Author(s):  
C. Granja ◽  
J. Jakubek ◽  
V. Linhart ◽  
M. Cevallos ◽  
J. Krug

2013 ◽  
Vol 7 (12) ◽  
pp. 943-943 ◽  
Author(s):  
Noriaki Horiuchi
Keyword(s):  

Author(s):  
T.F. Peterson ◽  
Hyunki Kim ◽  
M.J. Crawford ◽  
B.M. Gershman ◽  
W.C.J. Hunter ◽  
...  

2010 ◽  
Author(s):  
P. E. Malinowski ◽  
J.-Y. Duboz ◽  
J. John ◽  
C. Sturdevant ◽  
J. Das ◽  
...  

2016 ◽  
Vol 23 (1) ◽  
pp. 214-218 ◽  
Author(s):  
G. Bortel ◽  
G. Faigel ◽  
M. Tegze ◽  
A. Chumakov

Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two-dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.


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