Characterization of thin alumina films prepared by metal-organic chemical vapour deposition (MOCVD) by high resolution SEM, (AR)XPS and AES depth profiling
1995 ◽
Vol 353
(5-8)
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pp. 707-712
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Keyword(s):
1992 ◽
Vol 14
(1)
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pp. 43-45
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Keyword(s):
2008 ◽
Vol 41
(20)
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pp. 205416
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Keyword(s):
1994 ◽
Vol 64
(3)
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pp. 183-193
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1994 ◽
Vol 63
(3)
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pp. 145-153
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Keyword(s):
1995 ◽
Vol 72
(1-2)
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pp. 13-22
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Keyword(s):
1994 ◽
Vol 13
(2)
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pp. 149-158
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Keyword(s):
1995 ◽
Vol 254
(1-2)
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pp. 153-163
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