Effect of ultraviolet radiation on development of a conditioned defensive active avoidance reflex

1974 ◽  
Vol 78 (6) ◽  
pp. 1350-1352
Author(s):  
I. N. Dantsig
2020 ◽  
Vol 21 (2) ◽  
pp. 34-40
Author(s):  
A.F. Yakimovskii ◽  

Chronic experiments were performed on rats to study the influence of prolonged acetic zinc alimentary treatment on normal (spontaneous movement in “open field and condition active avoidance reflex in “shuttle box”) and abnormal (choreomyoclonic hyperkinesia, produced by intrastriatal microinjections GABA-A receptors antagonist picrotoxin  2 mcg) motor behavior. 4 mg acetic zinc is used by rats with food ball once a day. 12 mg zinc сonsumption by rats per week did not affected on normal behavior. While 24 mg is produced smaller negative effects on rats reflex performance to 6570% correct responses (of total present during the experiment) but to improved condition avoidance behavior, violated by picrotoxinin rats and reduce the reproducibility of picrotoxin-induced choreo-mioclonic hyperkinesis (human Huntington disease hyperkinesis analog). The influence of zinc on motor behavior depending on its dose and mode of administration is discussed.


Author(s):  
William J. Baxter

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.


2006 ◽  
Vol 175 (4S) ◽  
pp. 260-260
Author(s):  
Nicholas J. Rukin ◽  
Samuel J. Moon ◽  
Dhaval Bodiwala ◽  
Christopher J. Luscombe ◽  
Mark F. Saxby ◽  
...  

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