Raman microprobe technique diagnostic of YBCO films produced by laser ablation

1994 ◽  
Vol 16 (12) ◽  
pp. 2011-2017
Author(s):  
P. Martini ◽  
M. Mazzoni ◽  
S. Pestelli ◽  
L. Ulivi ◽  
M. Zoppi ◽  
...  
1990 ◽  
Vol 164-165 ◽  
pp. 279-291 ◽  
Author(s):  
B. Stritzker ◽  
J. Schubert ◽  
U. Poppe ◽  
W. Zander ◽  
U. Krüger ◽  
...  
Keyword(s):  

Author(s):  
P. Paturi ◽  
H. Huhtinen ◽  
M. Peurla ◽  
Yu. P. Stepanov ◽  
J. Raittila ◽  
...  

Author(s):  
B. STRITZKER ◽  
J. SCHUBERT ◽  
U. POPPE ◽  
W. ZANDER ◽  
U. KRÜGER ◽  
...  
Keyword(s):  

1990 ◽  
Vol 191 ◽  
Author(s):  
D. B. Fenner ◽  
D. K. Fork ◽  
G. A. N. Connell ◽  
J. B. Boyce ◽  
F. A. Ponce ◽  
...  

ABSTRACTThin epitaxial films of cubic - fluorite structured PrO2 and YSZ (yttria- stabilized zirconia) were grown on single crystal silicon substrates using the laser ablation - deposition technique. X-ray diffraction theta two - theta, omega rocking and phi scans indicate a high degree of epitaxial orientation of the films to the Si lattice. The highest quality of epitaxy was obtained with the PrO2 [111] oriented normal to Si(111) surfaces and the cubic YSZ [100] normal to Si(100) surfaces. For both PrO2 and YSZ, high epitaxial quality required the removal of the Si native oxide prior to deposition and careful control of the deposition environment. It was further found that the YSZ films on Si(100) were an excellent surface for subsequent laser ablation of YBCO films by the usual in situ process. The resistivity of this YBCO was ≈ 250 micro-ohm-cm at 300 K, extrapolated to the resistivity -temperature origin, showed a sharp transition to zero resistance at ≈ 85 K and was nearly identical to high quality YBCO films deposited on (bulk) YSZ substrates.


1992 ◽  
Vol 285 ◽  
Author(s):  
F. Sánchez ◽  
M. Varela ◽  
X. Queralt ◽  
R. Aguiar ◽  
J.L. Morenza

ABSTRACTSuperconducting YBa2Cu3Ox (YBCO) thin films have been deposited on Si(100) substrates with yttria-stabilized zirconia (YSZ) buffer layers by laser ablation. Buffers have been obtained by laser ablation as well. The films have been characterized by scanning electron microscopy, x-ray diffractometry, secondary ion mass spectrometry, and four-contact electrical resistivity measurements. Secondary ion mass spectrometry results indicate very low interdiffusion between Si, YSZ and YBCO. The best YBCO films are textured with c axis perpendicular to the substrate and their resistance shows a normal state metallic behavior with zero resistance at temperatures higher than 80 K. The properties of YBCO films have been related with the substrate temperature and oxygen partial pressure during deposition.


1989 ◽  
Vol 169 ◽  
Author(s):  
G. A. N. Connell ◽  
D. B. Fenner ◽  
D. K. Fork ◽  
J.B. Boyce ◽  
F.A. Ponce ◽  
...  

AbstractYSZ [ (Y2O3)x (ZrO2)1‐x ] buffer‐layers for various compositions, x, and YBCO (Y1Ba2Cu3O7‐δ) films were grown on hydrogen‐terminated Si(100) substrates by laser ablation. The structural and electrical properties of the YBCO are found to depend strongly on x, and to be optimized near x=0.1.


1987 ◽  
Vol 91 (9) ◽  
pp. 2273-2278 ◽  
Author(s):  
Hirofumi. Morishita ◽  
Tsutomu. Ishioka ◽  
Masamichi. Kobayashi ◽  
Kiyotaka. Sato

2006 ◽  
Vol 309-311 ◽  
pp. 1203-1206 ◽  
Author(s):  
Shigemi Tochino ◽  
Wen Liang Zhu ◽  
Takeshi Sawada ◽  
Junji Ikeda ◽  
Giuseppe Pezzotti

A non-destructive assessment of phase transformation and residual stress is presented for a 3 mol.% Y2O3 added ZrO2 ceramic using Raman microprobe spectroscopy. Low CIP pressure has been selected in the sample procedure to increase a potential to transform ZrO2. Aging tests were made and the transformation depth and residual stresses caused by transformation were evaluated by Raman spectroscopy A Raman microprobe technique using a visible wavelength laser coupled with a confocal optical device may enable one to retrieve spatially resolved information along the material subsurface. To demonstrate the potentiality of the confocal technique, aging of a ZrO2 sample has been made in autoclave and phase transformation gradually promoted from the surface towards the sub-surface of the sample (up to ~60 µm, in a sample autoclaved 168 h). Then, a quantitative spatially resolved assessment was attempted on these samples from their surface. The confocal information from the subsurface was compared with results of Raman spectroscopy collected from a cross-section. Accordingly, a quantitative equation was proposed, which allows the quantitative assessment of the thickness of the surface layer, which underwent phase transformation in ZrO2 ceramics, according to in-depth non-destructive assessments.


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