Investigation of the structure and composition of a {111} incoherent Zr/ZrN interface containing ledges by high-resolution transmission electron microscopy, image simulation, electron energy-loss spectroscopy, energy-filtering transmission electron microscopy, and near-coincidence-site analysis

2006 ◽  
Vol 37 (13) ◽  
pp. 879-893
Author(s):  
P. Li ◽  
J. M. Howe ◽  
W. T. Reynolds
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Transmission Electron Microscopy Image ◽  
Image Simulation ◽  
Site Analysis ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Microscopy Image ◽  
Electron Energy Loss

REW– exit-wave reconstruction and alignments for focus-variation high-resolution transmission electron microscopy images

2007 ◽  
Vol 40 (3) ◽  
pp. 614-614 ◽  
Author(s):  
F. Lin ◽  
Q. Chen ◽  
L.-M. Peng
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Maximum Likelihood Method ◽  
Transmission Electron Microscopy Image ◽  
Likelihood Method ◽  
Transmission Electron ◽  
Microscopy Image ◽  
Focus Variation ◽  
Microscopy Images

A Windows-based computer program has been developed for exit-wave reconstruction and experimental high-resolution transmission electron microscopy image alignment. While the exit-wave reconstruction is performed mainly using the maximum-likelihood method, image alignments may be carried out using several algorithms, including the time-consuming but robust genetic algorithm.

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