scholarly journals abTEM: ab Initio Transmission Electron Microscopy Image Simulation

2020 ◽  
Vol 26 (S2) ◽  
pp. 448-450
Author(s):  
Jacob Madsen ◽  
Toma Susi
2013 ◽  
Vol 750-752 ◽  
pp. 2267-2270
Author(s):  
Zhi Min Cui ◽  
Rong Li Sang ◽  
Yuan Liang Li ◽  
Qing Jun Zhang

Multifractal spectrums of sinter with different alkalinity were analyzed by multifractal software. The results show that sinter pore structure change from uniform to non-uniform with the improvement of alkalinity, Δα increases from 0.53 to 0.55. The structure of sinter pore is mainly microscopic by competition between macropores and micropores, Δf changes from 0.14 to-0.44. The distribution of sinter pores is quantitatively characterized by multi-fractal spectrum, which is consistent with transmission electron microscopy image.


Author(s):  
L. F. Fu ◽  
Y. C. Wang ◽  
B. Jiang ◽  
F. Shen ◽  
M. Strauss ◽  
...  

Abstract Recent developments in aberration-corrected transmission electron microscopy have drawn much attention from the semiconductor characterization community. Two new developments in transmission electron microscopy, image aberration correctors and probe aberration correctors, are discussed in term of their applications in characterizing gate oxide dielectrics for the IC industry.


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